Sketch image retrieval method based on joint space attention and metric learning
An image retrieval and metric learning technology, applied in the field of sketch image retrieval based on spatial attention and metric learning, can solve the problems of not further exploring the intrinsic relationship between edge maps and natural images, and the dispersion of intra-class distribution, so as to reduce storage space and query. The time required for the process, the effect of reducing the domain difference, and increasing the proportion
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[0036] In order to make the purpose, technical solution and advantages of the present invention clearer, the implementation manners of the present invention will be further described in detail below.
[0037] In order to achieve high-performance sketch image retrieval, an embodiment of the present invention proposes a sketch image retrieval method based on joint spatial attention and metric learning. For the implementation process, see figure 1 , including the following steps:
[0038] Step (1) acquires sketch and natural image data.
[0039] Step (2) Randomly sample to construct triplets.
[0040] Step (3) extracts edge maps from natural images and preprocesses all training images.
[0041] Step (4) constructs a semi-heterogeneous retrieval network based on joint spatial attention.
[0042] Step (5) Design and train the loss function for the retrieval network.
[0043] Step (6) pre-encodes the natural images in the gallery, and stores the natural images and their encoding...
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