Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Abnormal sampling point processing method and device based on waveform amplitude calculation feedback analysis

A processing method and sampling point technology, applied in measurement devices, spectrum analysis, instruments, etc., can solve problems such as short-time protection malfunction, and achieve the effects of improving reliability, improving protection selectivity, and avoiding calculation deviations

Pending Publication Date: 2022-02-25
STATE GRID ZHEJIANG ELECTRIC POWER CO LTD HANGZHOU POWER SUPPLY CO +2
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] The purpose of the present invention is to provide a method and device for processing abnormal sampling points based on waveform amplitude calculation feedback analysis, so as to solve the problem of short-time protection maloperation caused by abnormal sampling instantaneous values ​​in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Abnormal sampling point processing method and device based on waveform amplitude calculation feedback analysis
  • Abnormal sampling point processing method and device based on waveform amplitude calculation feedback analysis
  • Abnormal sampling point processing method and device based on waveform amplitude calculation feedback analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0074] Example 1 (Non-fault current overlay abnormal value)

[0075] 1.1 set

[0076] Overcurrent 1 paragraph, value 3A, time limit 0S.

[0077] 1.2 applied

[0078] The general load current, a sine wave having a magnitude of 0.5a, and 1 abnormal large value point (113a) is superimposed every 3 percent.

[0079] 1.3 action situation

[0080] Without the treatment of the method of the present invention, the calculated value of 1 permeable internal current after abnormal point is large and exceeded, and overcurrent protection is wrong, such as figure 2 The channel 7 (Ia calculation amplitude) and channel 11 (overcurrent 1) of the waveform map shown.

[0081] With the method of processing the invention, the current calculation value remains stable in the actual value, and the overcurrent protection does not move, such as figure 2 The channel 8 (Ia correction) of the waveform map (the Ia correction is calculated) and the passage 12 (overcurrent 1-segment correction operation).

Embodiment 2

[0082] Example 2 (Fault current stack adds a small amount of abnormal value)

[0083] 2.1 value

[0084] Overcurrent 1 segment, value 5A, time limit 0S.

[0085] 2.2 application

[0086] The fault current is a sine wave having a magnitude of 6A, and one abnormal large value point (113a) is superimposed for each 3 week wave.

[0087] 2.3 action situation

[0088] Without the treatment of the method of the present invention, the calculated value of 1 permeable inner wave after abnormal point is large and exceeded, the overcurrent protection action, due to the large impact of the abnormal large value on the calculated value, from the abnormal large value After 3 ms protection, this time, the real fault current just started, the calculated data window is less than 1 / 4 week, such as image 3 The channel 7 (Ia calculation amplitude) and channel 11 (overcurrent 1) of the waveform map shown.

[0089] With the method of processing of the present invention, the current calculation value is n...

Embodiment 3

[0090] Example 3 (Fault current is superimposed with a large number of abnormalities)

[0091] 3.1 set

[0092] Overcurrent 1 segment, value 5A, time limit 0S.

[0093] 3.2 application

[0094] The fault current, the magnitude is 6A sine wave, and the three abnormal large values ​​(113a) are added to each 3 per week.

[0095] 3.3 Action

[0096] Without the treatment of the method of the present invention, the calculated value of 1 permeable internal current at the end of the window is large and exceeded, the overcurrent protection action is exceeded, due to the large impact of the abnormal large value on the calculated value, from abnormalities After the high value starts, 3MS protection is actions. At this time, the real fault current just starts, and the calculation of the data window is less than 1 / 4 week, such as Figure 4 The channel 7 (Ia calculation amplitude) and channel 11 (overcurrent 1) of the waveform map shown.

[0097] With the method processing of the present invent...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an abnormal sampling point processing method and device based on waveform amplitude calculation feedback analysis. The method includes: based on an instantaneous value data window of an original sampling point of one cycle, calculating the waveform amplitude of the alternating quantity externally accessed by a protection device and feeding back the calculation result to a calculation module, so as to determine the threshold value of the abnormal point in the data window of the cycle according to the calculation result; comparing the instantaneous values of all original sampling points in the current cycle data window with the threshold value of theabnormal point, analyzing the matching reasonability between the two values, and if the instantaneous value of a certain sampling point exceeds the abnormal point threshold value, judging that the sampling point is an abnormal sampling point value; and if the number of the abnormal sampling points in the current cycle does not exceed the standard, correcting the abnormal point value, recalculating the waveform amplitude, and if the number of the abnormal sampling points exceeds the standard, judging that the calculation is invalid. According to the invention, protection maloperation caused by an instantaneous abnormal sampling point can be avoided, normal protection action during a fault is not influenced, and the reliability of the device is improved.

Description

Technical field [0001] The present invention belongs to the field of power system relay protection, involving an abnormal sample point processing method and apparatus for calculating feedback analysis based on waveform amplitude. Background technique [0002] The power system relay protection action criteria depends on the calculation of the sample value of the protection device, such as the main criterion of the overcurrent protection action is that the current calculated value is greater than the overflow value. The transmission of current in the power system is generally an alternating current of 50 Hz. If time is a horizontal coordinate, the instantaneous sample value is a longitudinal coordinate, and the current waveform can be expressed as a continuous sine wave of the cycle 20 ms. When the system is short-circuited, the current rises, the waveform form is still a sine wave, and the amplitude of the sine wave is increased. In the criterion of overcurrent protection, the cur...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/165
CPCG01R23/165
Inventor 吴振杰王源涛胡晨黄旭亮马伟刘东冉陈海燕金楷周劭亮王艳吴骞田骏魏洁茹金公羽
Owner STATE GRID ZHEJIANG ELECTRIC POWER CO LTD HANGZHOU POWER SUPPLY CO
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com