Temperature circulation box for chip security detection

Abstract

The invention discloses a temperature circulation box for chip safety detection, and belongs to the field of chip safety detection. The technical key points are that the temperature circulation box comprises a circulation box and a temperature control mechanism, the temperature control mechanism is installed in the circulation box, and an air supply pipe and a recovery pipe are installed on the temperature control mechanism; the inner side of the circulation box is fixedly provided with shelving frames which are arranged at equal intervals, the shelving frames are provided with detection discs, the inner side of the circulation box is fixedly connected with detection plates which are arranged at equal intervals, the detection plates and the shelving frames are arranged in a staggered mode, and the bottoms of the detection plates are provided with thermoelectric refrigeration sheet groups. According to the invention, chips to be detected can be separated, the situation that other chips to be detected are influenced when the chips burst, and consequently the detection structure is not accurate is avoided, meanwhile, the interior of the temperature circulation detection box is protected, a temperature changing mode is selected according to the use requirements of a user, the test requirements are met, and the practicability is higher.

Description

technical field [0001] The invention relates to the field of chip safety detection, in particular to a temperature cycle box for chip safety detection. Background technique [0002] The high and low temperature cycle box, also known as "high and low temperature alternating test box", is the necessary testing equipment in the fields of aviation, automobile, home appliances, scientific research, etc. It is used to test and determine the high temperature, low temperature or constant test of electrical, electronic and other products and materials The parameters and performance after the temperature environment changes. [0003] However, most of the existing devices are directly prevented by batches of chips. When one chip bursts, it will also affect the surrounding chips, affecting the detection results, and may cause damage to the inside of the temperature cycle box, and the heating method is single. , the heating effect is not good, and it cannot meet the realization requirem...

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Problems solved by technology

[0003] However, most of the existing devices are directly prevented by batches of chips. When one chip bursts, it will also affect the surrounding chips, affecting the detection results, and may cause damage to the inside of the temperature cycle box, and the heating method is single. , the heating effect is not good, and it cannot meet the realization requirements, so a temperature cycle box for chip safety detection is proposed to solve the above problems

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