Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Error measurement workpiece perpendicularity rapid evaluation method based on single reference plane

A technology of error measurement and datum plane, applied in the direction of measuring devices, instruments, etc., can solve the problems that are not easy to promote tolerance evaluation, complex mathematical model form, difficult verticality evaluation, etc., to achieve simple evaluation method, industrial possibility, Effects that are easy to scale

Pending Publication Date: 2022-01-14
GUILIN UNIV OF ELECTRONIC TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this type of method, the form of the mathematical model is relatively complicated, and the speed change is uneven, so it is not easy to be extended to various tolerance evaluations. Of course, this method is also difficult to be extended to the verticality of angle iron parts based on a single datum plane. evaluating
[0009] In summary, when the current geometric evaluation method is applied to the verticality of angle iron parts with a single reference plane, it is still unable to achieve stability, speed and simplicity at the same time.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Error measurement workpiece perpendicularity rapid evaluation method based on single reference plane
  • Error measurement workpiece perpendicularity rapid evaluation method based on single reference plane
  • Error measurement workpiece perpendicularity rapid evaluation method based on single reference plane

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0098] The following are specific examples of the present invention, and the solutions of the present invention will be further described with reference to the accompanying drawings, but the present invention is not limited to these examples.

[0099] Evaluate the verticality error of an L-shaped measuring workpiece based on a single datum plane, and its tolerance design specifications are as follows image 3 shown.

[0100] Step 1: Get the measurement point set of the reference segment { u j ,} and the measuring point set of the measured segment { u i}as follows:

[0101]

[0102] At this time, the initial key sequence numbers are 6 and 8;

[0103] At this time, the position of the upper boundary of the datum plane is z' 6 =0.0514 and the lower bound is z' 8 =0.0014;

[0104] Obtain the middle position of the border as middle=0.0264;

[0105] Establish the feature row vector set of datum plane measuring point { W j ,}as follows:

[0106]

[0107] After step 1...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of precision metrology and computer application, and relates to a method for evaluating a hole shaft part by combining a virtual gauge with measurement data in a mathematical model form, in particular to a method for evaluating the perpendicularity of an L-shaped error measurement workpiece based on a single reference plane, and the method comprises the following steps of: 1, acquiring a reference plane measurement point set and a measured element point set, and establishing a feature row vector set and a state element set; 2, acquiring an initial key sequence number set; 3, establishing an analysis matrix and an analysis column vector; 4, carrying out rank analysis; 5, determining an optimizing direction; 6, solving a new key point, and updating the coordinates of the measuring point set; 7, judging whether the reference element evaluation meets a qualified condition or not; 8, updating the measured element point set; 9, updating a real-time state element set; 10, updating the key sequence number set of the measured elements; 11, establishing an analysis matrix and an analysis column vector; 12, carrying out rank analysis; 13, determining an optimizing direction; 14, solving a new key point, and updating the coordinates of the measurement point set; and 15, carrying out qualification judgment.

Description

technical field [0001] The invention belongs to the field of precision metrology and computer application, and in particular relates to a stable, fast and simple method for evaluating the perpendicularity of a workpiece based on a single reference plane for error measurement, which can be used for the qualification detection of the verticality of an L-shaped measuring workpiece with a single reference plane As well as error evaluation, the evaluation results can provide useful guidance for the improvement of processing technology. Background technique [0002] The present invention takes the L-shaped error measurement workpiece as an example to verify a method for quickly evaluating the perpendicularity of the L-shaped error measurement workpiece based on a single reference plane. The specific placement of the workpiece is that the bottom surface of the L-shaped workpiece fits the horizontal surface, and the side is vertical to the bottom surface. Take the bottom surface of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/22
CPCG01B21/22
Inventor 黄美发梁健伟唐哲敏苟国秋
Owner GUILIN UNIV OF ELECTRONIC TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products