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Linear broadening elimination method under wavelength shift

A technology of wavelength shift and line shape, which is applied in the field of environmental optics, can solve the problems of wavelength shift, angle of single hardware structure, complex and diverse line shape broadening, etc., and achieve the effect of improving measurement accuracy and eliminating broadening

Active Publication Date: 2022-01-07
ANHUI AGRICULTURAL UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the existing technology can solve the problem of wavelength shift to a certain extent, in the actual measurement process, the line type broadening is complicated and diverse, and it cannot be fundamentally solved only by changing the angle of the hardware structure.

Method used

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  • Linear broadening elimination method under wavelength shift
  • Linear broadening elimination method under wavelength shift
  • Linear broadening elimination method under wavelength shift

Examples

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Embodiment Construction

[0050] In this example, see figure 1 , a line broadening elimination gas detection system, comprising: a laser 3, a controller 2, a function generator 1, a calibration path, a detection path, and an acquisition processor. Among them, the calibration path is composed of a collimator 4, a standard reference cell 5, and a photodetector 6; the detection path is composed of a collimator 7, a multiple reflection cell 8, and a photodetector 9;

[0051] The laser 1 is used as a detection light source for measurement, and the temperature control and current control are performed by the controller 2, thereby changing the output wavelength of the laser 1; the function generator 1 provides scanning signals and modulation signals to the current driver of the controller 2, and acts on the laser 3 together. , the output of the tuned laser is stable; after the laser splits, it passes through the calibration path and the detection path respectively, wherein the laser beam of the calibration pa...

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PUM

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Abstract

The invention discloses a linear broadening elimination method under wavelength shift. The method is used for processing based on first harmonic signals. The method comprises the following steps of: 1, performing filtering after removing background noise; 2, fitting standard first harmonics, specifically, introducing a confidence coefficient and a standard deviation to server as a judgment standard for judging whether standard primary harmonic self-adaptive fitting on a fitted non-absorption region is finished or not, so as to obtain standard primary harmonic fitting signals, providing a basis for elimination of linear broadening; and 3, carrying out twice signal adjustment, firstly carrying out coarse adjustment, fitting local signals, carrying out interpolation for fine adjustment, eliminating broadening. According to the method of the invention, on the basis of not increasing a hardware structure, through the linear broadening elimination method under the wavelength shift, the linear broadening problem under the wavelength shift is solved, and the measurement accuracy is improved.

Description

technical field [0001] The invention relates to the field of environmental optics, and specifically aims at the influence of the line broadening caused by the wavelength shift, and proposes a method for eliminating the line broadening caused by the wavelength shift. Background technique [0002] When using laser spectroscopy for gas detection, temperature changes, current scanning signal DC level drift, driving current and temperature drift, incomplete coupling of thermistor and laser chip, optical path, circuit aging, etc. will cause laser wavelength shift, It leads to line broadening and affects the accuracy of gas concentration measurement. Therefore, it is of great research significance to effectively eliminate the problem of line broadening and improve the long-term stability and accuracy of measurement. [0003] Existing researches mainly focus on improving the hardware system such as temperature control and locking to reduce the drift problem, and seldom discuss how ...

Claims

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Application Information

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IPC IPC(8): G01N21/25
CPCG01N21/255G01N21/25
Inventor 唐七星王玉伟刘海秋刘路张玉钧陈东
Owner ANHUI AGRICULTURAL UNIVERSITY
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