Film uniformity detection system based on line structured light

A technology of film uniformity and detection system, which is applied in the testing of machine/structural components, optical instrument testing, and testing of optical properties, etc. It can solve the problem that there are many isolated noise points in the film image, affecting the subsequent processing of the image, and affecting the accuracy of film identification, etc. problem, to achieve the effect of fewer noise points and better image effect

Pending Publication Date: 2021-11-09
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI +1
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  • Claims
  • Application Information

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Problems solved by technology

However, for films with reflective surfaces, such as polyester films, there are many isolated noise points in the collected film images

Method used

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  • Film uniformity detection system based on line structured light
  • Film uniformity detection system based on line structured light
  • Film uniformity detection system based on line structured light

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Embodiment Construction

[0028] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0029] see figure 1 , the embodiment of the present invention includes:

[0030] A film uniformity detection system based on line structured light, including an imaging unit, an acquisition unit, a processing unit, a storage unit, a control unit, a display unit, and an execution unit.

[0031] combine figure 2 , the imaging unit is used to generate a grid image, including a light source, an optical filter and a grid diffraction grating in turn, the light emitted by the light source passes through the filter to adjust the light intensity and wavelength of the light source, and then diffracted after passing through the grid diffraction grating L...

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Abstract

The invention discloses a thin film uniformity detection system based on linear structured light. The thin film uniformity detection system comprises an imaging unit, an acquisition unit, a processing unit, a storage unit and a control unit, wherein the imaging unit is used for generating a grid image and sequentially comprises a light source, an optical filter and a grid diffraction grating, light emitted by the light source passes through the optical filter to adjust the light intensity and wavelength of the light source and then passes through the grid diffraction grating to be diffracted and split, and continuous grid light spots are formed and projected to a measured area of the thin film; the acquisition unit comprises an objective table and a plurality of line-scan digital cameras, and is used for acquiring the grid image and carrying out multi-camera calibration; and the processing unit is used for identifying the grid image by adopting a preset film uniformity detection model and detecting whether the grid image is distorted so as to realize film uniformity consistency judgment. According to the invention, the problem of many isolated noise points of the collected surface reflective film image can be solved, and uniformity detection of the film surface is realized.

Description

technical field [0001] The invention relates to the technical field of film uniformity detection, in particular to a film uniformity detection system based on line structured light. Background technique [0002] Thin films are widely used in LCD TVs, tablet computers, smart phones, car display screens and other fields. Limited by the production process or production environment, the film is prone to quality defects during the production process, mainly manifested in uneven thickness and scratches on the surface. There are traces, internal bubbles, or impurities, dust, etc. inside the film. Therefore, film uniformity testing has become an important part of the quality control of film materials. [0003] Traditional detection is generally carried out by experienced inspectors through visual inspection and simple measurement. The detection results lack reliability and accuracy, cannot be quantitatively evaluated, and are difficult to conduct long-term observations. Due to its ...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/0278
Inventor 董俊马冬何俊明马凡徐盼盼姜铭坤黄小文
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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