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Off-line in-situ stretching device for X-ray diffraction experiment

An in-situ stretching, off-line technology, applied in measuring devices, using wave/particle radiation for material analysis, using stable tension/pressure to test material strength, etc., can solve problems such as inability to adapt to X-ray diffraction experiments

Active Publication Date: 2021-09-14
CHINALCO MATERIALS APPL RES INST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides an off-line in-situ stretching device for X-ray diffraction experiments to solve the problem that the stretching devices in the prior art cannot adapt to X-ray diffraction experiments

Method used

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  • Off-line in-situ stretching device for X-ray diffraction experiment
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  • Off-line in-situ stretching device for X-ray diffraction experiment

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Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0042] Such as figure 1As shown, the embodiment of the present invention provides an off-line in-situ stretching device for X-ray diffraction experiments, which includes a loading component and a stretching component. Wherein, the loading assembly includes a bracket 11 and a tension driving assembly...

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Abstract

The invention provides an off-line in-situ stretching device for an X-ray diffraction experiment. The device comprises a loading assembly which comprises a support and a stretching drive assembly, and a stretching assembly, wherein the stretching assembly is detachably arranged on the support, the stretching assembly comprises two stretching modules which are symmetrically arranged in the length direction, the two stretching modules are used for stretching a test piece, the test piece is fixed to the surfaces of the two stretching modules, and the stretching driving assembly is in driving connection with the two stretching modules; therefore, the two stretching modules synchronously move in the same direction or in the opposite directions. According to the device, a technical problem of in-situ stretching in the X-ray diffraction experiment can be solved.

Description

technical field [0001] The invention relates to the technical field of material microstructure and mechanical performance testing, in particular to an off-line in-situ stretching device for X-ray diffraction experiments. Background technique [0002] With the advancement of science and technology, the equipment manufacturing industry has higher and higher performance requirements for engineering materials such as aerospace, rail transit, and automotive lightweighting. As we all know, the microstructure of a material determines its macroscopic performance. To break through the bottleneck of the use of materials, it is necessary to find the corresponding relationship between the microstructure and the macroscopic performance, which will involve many complicated mechanical problems of engineering materials. [0003] In order to further study the relationship between the performance and structure of materials, in-situ testing of materials is usually required. When performing in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/08G01N3/02G01N3/04G01N23/207
CPCG01N3/08G01N3/02G01N3/04G01N23/207G01N2203/0017
Inventor 董学光范荣辉刘贞山邹立颖王眉眉谷宁杰韦绍林高崇周保成苏明山
Owner CHINALCO MATERIALS APPL RES INST CO LTD
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