A Single-Shot 2D DOA Estimation Method Based on Three Parallel Line Arrays
A parallel-line, single-snapshot technology, applied to direction finders using radio waves, radio wave direction/deviation determination systems, etc., can solve problems such as poor estimation performance, failure, large array aperture and loss of freedom, and achieve The effect of low DOF loss, good resolving power and statistical performance
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0051] The implementation process and effects of the method proposed by the present invention are described in conjunction with computer simulation experiments.
[0052] The type of noise received in the simulation is zero the average value Gaussia white noise, and between signal and noise, both the noise of different cell elements is independent; and the initial phase of the simulated single fast shot signal is random.
[0053] (1) Target resolution of the method of the invention
[0054] Simulation Scene 1: The total number of three flat lines in the space is 37, wherein the number of array elements of the intermediate line array is 13, the remaining two linear array elements are 12, and DOA estimation, signal-to-noise is performed by the method of the present invention. 2D DOA estimated scattering images when 10 dB figure 2 Distance
[0055] Simulation scene 2: Receive array structure with simulation scene 2, 2000 Monte-Carlo experiments for 2000 Monte-Carlo experiments when th...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com