Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Superconducting high-frequency test system and method

A test system and test method technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as inconsistent circuit working conditions, and achieve the effect of simple circuit structure

Active Publication Date: 2021-06-25
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF13 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a superconducting high-frequency testing system and method for solving the problem of inconsistency between the high-frequency test in the prior art and the actual working conditions of the circuit to be tested

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Superconducting high-frequency test system and method
  • Superconducting high-frequency test system and method
  • Superconducting high-frequency test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0073] This embodiment provides a superconducting high-frequency test system, which includes: a high-frequency clock generation module 1 , a high-frequency clock control module 2 , a linear feedback shift register 3 and an output conversion module 4 .

[0074] Specifically, the high-frequency clock generation module 1 is implemented based on a ring oscillator, receives a trigger pulse signal, and outputs a periodic high-frequency clock signal.

[0075] As an example, such as figure 2 As shown, the high-frequency clock generation module 1 includes a combiner 11 and a first shunt unit 12; the combiner 11 receives a trigger pulse signal and a split clock signal, and outputs a combined clock signal; the first split The unit 12 receives the combined clock signal, outputs two signals identical to the combined clock signal, one is output as the split clock signal, and the other is output as the high-frequency clock signal.

[0076] Such as figure 2 As shown, the combiner 11 and t...

Embodiment 2

[0099] This embodiment provides a superconducting high-frequency test method. In this embodiment, the superconducting high-frequency test method is implemented based on the superconducting high-frequency test system in Embodiment 1. In practical applications, the method can be based on any A system capable of implementing the method is not limited to this embodiment. Include the following steps:

[0100] The high-frequency clock generation module 1 receives the trigger pulse signal and outputs a periodic high-frequency clock signal;

[0101] The high-frequency clock control module 2 receives the control pulse signal, controls the continuity of the high-frequency clock signal, and outputs the high-frequency control clock signal;

[0102] The linear feedback shift register 3 receives an initial signal, sets a non-zero initial state for the linear feedback shift register 3 based on a low-frequency clock signal, and simultaneously outputs the periodicity of multiple preset cycle ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a superconducting high-frequency test system and method, and the method comprises the steps: firstly receiving a trigger pulse signal, and outputting a periodic high-frequency clock signal; controlling connection and disconnection of the high-frequency clock signal and outputting a high-frequency control clock signal is output; receiving an initial signal, setting a non-zero initial state for the linear feedback shift register, and simultaneously outputting multiple paths of periodic pseudo-random sequences with preset period lengths based on a high-frequency control clock signal; receiving, by the to-be-tested circuit, the multiple paths of pseudo-random sequences and outputting multiple paths of test signals; receiving the multi-path test signals, and outputting multi-path conversion signals based on low-frequency clock signals; comparing the multiple paths of conversion signals with an expected output result, and determining whether the circuit to be tested works normally or not. The circuit structure is relatively simple; the input signal is a pseudo-random sequence generated based on a linear feedback shift register, continuous high-frequency testing can be achieved, and the actual working condition of a circuit to be tested is better met.

Description

technical field [0001] The invention relates to the field of superconducting circuits, in particular to a superconducting high-frequency testing system and method. Background technique [0002] Superconducting SFQ (Single Flux Quantum, single flux quantum) circuits have great potential to be used in high-performance computing and other fields because their two performance indicators, speed and power consumption, are superior to semiconductor CMOS circuits. Therefore, testing the high-frequency performance of the circuit is a very important step in the design of superconducting SFQ circuits, and it is also an important step to truly reflect the advantages of superconducting circuits. In superconducting circuit design, to build a large-scale digital circuit, from the high-frequency design of each gate circuit (cell) used to the high-frequency design of each module to the high-frequency design of the entire system, it is necessary to pass the actual high-frequency test. Verifi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/28
CPCG01R31/282G01R31/2832
Inventor 任洁陈理云应利良王镇
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com