A board defect area extraction method and device

An extraction method and an extraction device technology, which are applied in the field of extraction of defect areas on board surfaces, can solve problems such as the inability to meet the running speed of a production line, increase in missed detection rate and false detection rate, and long calculation time, so as to save the time required for detection, The effect of reducing time and improving accuracy

Active Publication Date: 2021-05-25
SHANDONG JIANZHU UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing technology, the size of the image generally collected is about 2560×2048 pixels, the amount of data is large, and the calculation takes a long time, which cannot meet the running speed of the production line
If the calculation speed is increased to adapt to the running speed of the production line, the only way to reduce the amount of calculation is to reduce the detection accuracy, but this may increase the missed detection rate and false detection rate.

Method used

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  • A board defect area extraction method and device
  • A board defect area extraction method and device
  • A board defect area extraction method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0057]Such asfigure 1 As shown, the present embodiment provides a method of extraction of a panel defect area, including:

[0058]Gets the board surface image to be detected and split, resulting in multiple detection units;

[0059]Gets the gradation threshold corresponding to the plurality of detection units;

[0060]The gradation mean value of the detecting unit is calculated and compared to the corresponding gradation threshold, determines whether or not the deficiencies in the detecting unit are included.

[0061]In the above scheme, by dividing the panel surface image to be detected into a plurality of detection units, the accuracy of the determination result is improved for each detection unit for each detecting unit, which has a corresponding gradation threshold for judging whether or not it contains defects. . At the same time, all the detection units containing the defects constitute the defective area on the panel, and the subsequent defects can be further identified, that is, the def...

Embodiment 2

[0096]Such asimage 3As shown, the present embodiment provides an extraction device of a plate surface defect region for achieving an extraction method of a panel defect region according to an embodiment described above. The extraction device of the panel defect area includes:

[0097]The image processing module is used to segment the board surface image to obtain multiple detection units;

[0098]The analysis module is connected to the image processing module, and the gradation mean for calculating the detection unit is calculated and compared to the acquired gradation threshold, determining whether the detection unit contains defects.

[0099]Further, the grayscale threshold includes a high threshold and a low threshold, and the extraction device of the panel defect area further includes a training module.

[0100]The training module is connected to the analysis module to obtain a high threshold TH_L [I] [J] and low threshold TH_L [I] [J] and low threshold TH_H [I] [J] and low thresholds. TH_L...

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Abstract

The invention belongs to the technical field of industrial detection, and discloses a board defect area extraction method and device, and the method comprises the steps of obtaining a to-be-detected board image, and carrying out the segmentation of the image, and obtaining a plurality of detection units; obtaining gray threshold values in one-to-one correspondence with the multiple detection units; and calculating a gray average value of the detection unit, comparing the gray average value with a corresponding gray threshold value, and judging whether the detection unit contains defects or not. According to the invention, the to-be-detected board image is divided into the plurality of detection units, whether each detection unit contains defects or not is judged, the accuracy of the judgment result is improved, meanwhile, all the detection units containing the defects jointly form the defect area on the board; when the defects are further identified subsequently, only the detection units containing the defects are analyzed, so that the amount of data needing to be processed is greatly reduced, and the time required for detecting the defects of the board is shortened.

Description

Technical field[0001]The present invention belongs to the field of industrial detection, and in particular, to a method and apparatus for extracting a plate defect region.Background technique[0002]Whether the plate surface of the sheet is defective is one of the standards that measures the quality of the sheet, generally detecting the panel defect detection directly on the production line to determine whether the produced sheet is qualified. Taking a particleboard as an example, the most advanced particle production equipment is currently a continuous press production line. Machine vision technology is the mainstream of industrial non-destructive testing technology, but in the field of plate surface defect detection, lack of relatively mature systems to achieve machine visual techniques. Therefore, most of the particleboard manufacturers still rely on workers to detect with naked eye on continuous production lines, and determine whether produced particleboard panels have defects. Ho...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/136G06T3/40G06T7/187
CPCG06T7/0008G06T7/11G06T7/136G06T7/187G06T3/4038G06T2207/10004G06T2200/32
Inventor 周玉成赵子宇王永正陈龙现刘传泽
Owner SHANDONG JIANZHU UNIV
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