High-precision DAC test system based on FPGA

Abstract

The invention discloses a high-precision DAC testing system based on an FPGA, and belongs to the field of semiconductor chip testing. The high-precision DAC test system based on the FPGA comprises an FPGA development board, a power supply, a DAC test board, a spectrum analyzer, an oscilloscope and a digital multimeter, the power supply is connected with the FPGA development board and the DAC test board and provides stable voltage for the FPGA development board and the DAC test board; the FPGA development board sends parallel digital signals and clock signals to the DAC test board, and the DAC test board converts the digital signals into analog quantity and outputs the analog quantity; and the DAC test board is respectively connected with the spectrum analyzer, the oscilloscope and the digital multimeter, and is used for analyzing the output analog quantity. The FPGA design technology is adopted, static parameter testing and dynamic parameter testing of the digital-to-analog converter can be completed, the testing efficiency of the digital-to-analog converter is improved. Meanwhile, the testing function can be expanded according to the actual testing requirement, and the testing cost is low.

Description

technical field [0001] The invention relates to the technical field of semiconductor chip testing, in particular to an FPGA-based high-precision DAC testing system. Background technique [0002] In recent years, with the rapid development of integrated circuits, digital signal processing technology has been more and more widely used. Compared with analog signal processing, digital signal processing has many advantages, such as the performance of digital systems and less sensitive to changes in voltage, process, temperature, etc.; digital circuits are easy to automate design, making it possible to realize complex systems; digital systems have Very good programmability, so the functions of the system can be flexible and diverse; digital signals are easy to store and transmit; in addition, with the development of CMOS manufacturing technology, the speed of digital circuits will become faster and the power consumption will be lower. However, almost all physical signals from nat...

AI Technical Summary

Problems solved by technology

However, due to the complex structure of the system, the cost of high-precision ATE is quite high, and with the improvement of semiconductor technology and design level, the performance of chips is also continuously improved, and the ATE used to test these chips also needs higher precision. Meet the test needs, which will further increase the cost of the chip

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