Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Scanning method adapted to scanning tunnel microscope

A scanning method and scanning tunnel technology, which are applied in scanning probe microscopy, scanning probe technology, measuring devices, etc., can solve the problem of increasing scanning time, and achieve the effect of improving imaging speed and ensuring measurement accuracy.

Inactive Publication Date: 2003-11-05
TIANJIN UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The existing scanning mode has two disadvantages. One is that when the scanner scans to a certain point, even if the tunnel current is equal to the current setting value, the scanner still has to wait for a fixed time before scanning the next point. The reason for the increase of scanning time; the second is that when the scanner scans to a certain point, if the tunnel current is not equal to the current setting value, the scanner will wait for a fixed time, regardless of whether the tunnel current value is equal to the current setting value, then proceed to the next step. A scan of a point makes the data of this point a false data

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Scanning method adapted to scanning tunnel microscope
  • Scanning method adapted to scanning tunnel microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] specific implementation plan

[0011] It is suitable for the scanning method of scanning tunneling microscope. The scanning motion of the X and Y scanners is controlled by the coincidence signal generated by the tunnel current detection and current setting value comparison circuit. The process is: the tunnel current is amplified to 0 by the amplifier of the probe The voltage of ~5V is converted into a digital signal by a 16-bit A / D converter and enters the computer; the computer performs a comparison operation according to the control program, and if it does not match, it continues to adjust the displacement; if it matches, the computer sends out a control signal , through the X direction, (if the X direction scans to the maximum point position, it is the Y direction), the 20-bit D / A converter converts it into a voltage signal of 0 ~ 10V, and sends it to the X direction (if the X direction scans to the maximum point position, then it is the Y...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A scanning method suitable for scanning tunneling microscopes, that is: the tunnel current is amplified by the amplifier of the measuring head to a voltage of 0-5V, converted into digital signals by a 16-bit A / D converter and sent to the computer; the computer follows the control program. Comparison operation, if it does not match, continue to adjust the displacement; if it matches, the computer sends a control signal, which is converted into 0~10V by the 20-bit D / A converter in the X direction (if the X direction scans to the maximum point position, then it is the Y direction). The voltage signal is sent to the high-voltage generator in the X direction (if the X direction scans to the maximum point position, it is the Y direction), the voltage and power are amplified by the high-voltage generator, and the amplified voltage is 0-300V, which is added to the piezoelectric On ceramics, make the probe generate a predetermined displacement in the X direction (if the X direction scans to the maximum point position, it will be the Y direction), repeat this process until the X and Y are both at the maximum value. The invention improves the imaging speed and ensures the measurement accuracy.

Description

technical field [0001] The invention relates to a scanning tunneling microscope, in particular to a scanning method suitable for the scanning tunneling microscope. Background technique [0002] Scanning tunneling microscopes can be divided into constant height method detection and constant current method detection according to different detection methods. The constant-height method is to keep the needle tip on a horizontal plane with a constant height above the sample for scanning motion, and detect the change of the tunnel current. The detection data set represents the morphology and electrical characteristics of the sample surface. A topographic image of the sample surface can be made with this data set. The constant height method has a faster test speed because it does not need to move the height of the needle tip; but it is only suitable for relatively smooth sample surfaces. The constant current method uses the feedback method to adjust ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/14
Inventor 傅星胡小唐魏小雷
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products