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Double-view-field scanning infrared optical system

An infrared optical system and dual field of view technology, applied in the field of infrared optics, can solve problems such as low transmittance, difficult assembly and debugging, complex structure, etc., and achieve the effect of improving transmittance, easy to find and locate, and wide application prospects

Pending Publication Date: 2021-03-26
11TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to solve the problems of complex structure, difficult assembly and debugging, and low transmittance of the scanning infrared optical system in the related art. The present invention proposes a dual-field scanning infrared optical system

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Embodiment Construction

[0034] In order to further explain the technical means and functions adopted by the present invention to achieve the intended purpose, the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0035] Such as figure 1 and figure 2 As shown, the dual-field scanning infrared optical system 100 according to the embodiment of the present invention includes sequentially arranged along the propagation direction of the light: a telescopic assembly 10, a scanning mirror assembly 20, an imaging lens assembly 30, and an infrared detector assembly 40. Infrared radiation enters the dual-field scanning infrared optical system 100 through the telescopic assembly 10 , and the scanning mirror assembly 20 scans and selects light rays of different fields of view to enter the subsequent imaging lens assembly 30 , and finally image on the target surface of the infrared detector assembly 40 .

[0036] Wherein, the telephoto ...

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Abstract

The invention provides a double-view-field scanning infrared optical system, which comprises a telescopic assembly, a scanning mirror assembly, an imaging lens assembly and an infrared detector assembly which are sequentially arranged along the propagation direction of light, and is characterized in that the telescopic assembly comprises a position-adjustable view field lens group; when the view field lens group is adjusted to a light propagation path in the double-view-field scanning infrared optical system, the double-view-field scanning infrared optical system is in a large-view-field scanning mode; and when the field lens group is adjusted to move out of the light propagation path in the dual-field scanning infrared optical system, the dual-field scanning infrared optical system is ina small-field scanning mode. According to the double-view-field scanning infrared optical system, modular design is adopted, all the module subassemblies can be tested independently, and testing and assembling are convenient and fast. Moreover, the transmittance of a small field of view is improved, and the energy received by the system during long-distance target observation is increased, so thatthe double-field-of-view scanning infrared optical system has good imaging quality and a wide application prospect.

Description

technical field [0001] The invention relates to the technical field of infrared optics, in particular to a dual-view field scanning infrared optical system. Background technique [0002] With the development of infrared detectors, multi-functional and high-precision requirements are put forward for infrared optical systems. Infrared-cooled area array detectors have the problems of high cost and high blind element rate, so their use is limited; It is an important supplement to the type area array detector and has been widely used in some fields with lower real-time requirements. The infrared photoelectric system based on the line array detector has a slightly more complex scanning mode and working mode than that of the area array detector, and a scanning mechanism must be introduced to make the rays of different fields of view converge on the target surface of the line array detector for imaging, so the optical system must also be It is specially designed to adapt to the us...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B13/00G02B26/00G02B26/10
CPCG02B13/00G02B26/00G02B26/10
Inventor 彭晴晴王希杜晓宇
Owner 11TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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