Dual-band high-spectral-resolution lightning high-speed imager

Abstract

The invention discloses a dual-band high-spectral-resolution lightning high-speed imager, which comprises a front optical system, a collimation system, an interference system and a rear imaging system, and is characterized in that after a radiation light beam of a measured target is collected and converged by the front optical system, an incident light beam is collimated by the front collimation system to form parallel light to be incident to a beam splitter; an incident light beam is divided into two beams of parallel light which are equal in intensity and perpendicular to each other; the twobeams of light irradiate sub-gratings in the double-grating module respectively, return after diffraction occurs on each sub-grating, reach the beam splitter again to converge again to generate interference, form localized interference fringes at the grating surface position, and image interference fringe patterns are imaged on the imaging detector through the rear optical imaging system, and Fourier transform is carried out on the recorded interference patterns to restore the spectral information of the measured target.

Description

technical field [0001] The invention relates to spectral imaging equipment, in particular to a lightning high-speed imager. Background technique [0002] Lightning is a high-voltage discharge phenomenon in the atmosphere, and its channel is composed of highly ionized plasma. The spectral information of lightning can reflect the basic physical characteristics of the channel, such as temperature, electron concentration, and conductivity. Spectral identification has become an important tool in the study of lightning, and the study of lightning spectra can better understand the composition of the atmosphere and the mechanism of the discharge process in the atmosphere. [0003] At present, two methods are mainly used for lightning spectrum observation: one is to point the slit spectrograph to the sky where the lightning is emitted and receive the lightning light through the slit. The early work in China is represented by the work of Tu Fei-Cheng Maolan (1949). The advantage of h...

AI Technical Summary

Problems solved by technology

The slitless spectrometer can measure near-infrared lightning, and can record and image lightning through a very short exposure time, and obtain spectral information at the same time, and can also be used to study the change of lightning channel characteristics with height; but it is affected by many factors , its spectral resolution is limited

[0004] Therefore, although there have been some studies on the detection of lightning spectra, due to the inherent limitations of existing instruments, it is still impossible to obtain lightning channel morphology and high-resolution spectral information at the same time in a short exposure.

Images