Active infrared nondestructive testing device and testing method thereof

An infrared non-destructive testing, active technology, used in material defect testing, optical testing flaws/defects, etc., to achieve the effect of rapid positioning

Pending Publication Date: 2021-03-19
合肥利弗莫尔仪器科技有限公司
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  • Abstract
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  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide an active infrared non-destructive testing device and its detection method, which combines the two methods of laser-induced infrared radiation detection and phase-locked infrared thermal imaging to solve the problem of rapid discovery and high-speed detection in non-destructive testing. The double problem of resolution measurement

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  • Active infrared nondestructive testing device and testing method thereof

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Embodiment Construction

[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0017] See figure 1 , an active infrared nondestructive testing device, including a laser-induced light source 1, a sample scanning motion device 5, an infrared filter 6, an infrared detector 7, a lock-in amplifier 8, an infrared lens 9 and an infrared camera 10, an infrared lens 9 Connected to the infrared camera 10, the sample scanning motion device 5 is used to fix the sample 4 to be tested and drive the sample 4 to be translated. The infrared camera 10 and...

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Abstract

The invention discloses an active infrared nondestructive testing device and a testing method thereof. The active infrared nondestructive testing device comprises a laser-induced light source, a sample scanning motion device, an infrared optical filter, an infrared detector, a lock-in amplifier and an infrared camera connected with an infrared lens, the sample scanning motion device is used for fixing a to-be-detected sample and driving the to-be-detected sample to translate, the infrared camera and the laser-induced light source are located on the same side of the to-be-detected sample and face the surface of the to-be-detected sample, and the infrared detector is arranged on the other side of the to-be-detected sample and faces the surface of the to-be-detected sample. The infrared optical filter is located between the infrared detector and the to-be-detected sample, and the output end of the infrared detector is connected with the lock-in amplifier. According to the invention, a laser-induced infrared radiation detection method and a phase-locked infrared thermal imaging method are combined, so that the dual problems of rapid discovery and high-resolution measurement in nondestructive testing are solved.

Description

technical field [0001] The invention relates to the field of optical nondestructive testing, in particular to an active infrared nondestructive testing device and a testing method thereof. Background technique [0002] The quality of the material directly affects its application. Some materials require no contact and no damage during the detection process. Active laser infrared non-destructive testing technology can meet the testing conditions. The basic principle of active laser infrared non-destructive testing technology is: a modulated laser beam is incident on the surface of the sample, and the sample absorbs the energy of the incident laser beam, which will cause a change in the local temperature of the sample, and the temperature change will cause the sample to generate infrared radiation signals , the infrared device collects these infrared radiation signals, and by analyzing the infrared radiation signals, the material characteristics such as thermal performance para...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/72G01N21/95
CPCG01N21/95G01N25/72
Inventor 张健周海峰陈坚吴周令
Owner 合肥利弗莫尔仪器科技有限公司
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