Hundred-kilovolt ultrafast electron diffraction device

An electron diffraction, ultra-fast technology, applied in measurement devices, material analysis using wave/particle radiation, instruments, etc., can solve the problem of inability to achieve rapid disassembly and upgrade maintenance, etc., to shorten sample distance, reduce complexity, increase The effect of flexibility

Inactive Publication Date: 2021-03-12
INST OF PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a flexible and compact 100-kilovolt ultrafast electron diffraction device to solve the problem that the existing compact ultrafast electron diffraction device proposed in the above background technology cannot be quickly disassembled and upgraded for maintenance

Method used

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  • Hundred-kilovolt ultrafast electron diffraction device
  • Hundred-kilovolt ultrafast electron diffraction device
  • Hundred-kilovolt ultrafast electron diffraction device

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Embodiment Construction

[0035] The present invention will be further illustrated by specific examples below, but it should be understood that these examples are only used for more detailed description, and should not be construed as limiting the present invention in any form.

[0036] This section provides a general description of the materials and test methods used in the tests of the present invention. While many of the materials and methods of manipulation which are employed for the purposes of the invention are well known in the art, the invention has been described here in as much detail as possible. It will be apparent to those skilled in the art that, in the context and context, the materials used and methods of operation used in the present invention are known in the art unless otherwise indicated.

[0037] see Figure 1-8, the present invention provides a technical solution: a flexible and compact hundreds of kilovolts ultrafast electron diffraction device, comprising an electron gun body 1...

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Abstract

The invention discloses a flexible and compact hundred-kilovolt ultrafast electron diffraction device which comprises an electron gun body, and the electron gun body comprises an electron gun chamber,and a direct-current photocathode electron gun body, a magnetic lens, a sample chamber, a pump light back incidence unit, a Faraday cup chamber and an imaging device arranged in the electron gun chamber, a sample displacement table is fixedly installed on the side face of the sample chamber, a sample fixing device is fixedly arranged in the sample displacement table, and a titanium sublimation pump, an ion pump, a molecular pump and a vacuum measuring device are fixedly arranged at the bottom of the sample chamber. According to the flexible and compact hundred-kilovolt ultrafast electron diffraction device, the direct-current photocathode electron gun body and the sample holder are flexible and multifunctional, so that the whole device can carry out various experimental detection, the sample holder is detachable and replaceable, and some devices needing to be connected in series between the electron gun body and the sample chamber can be connected to the sample rod; the complexity ofthe system is reduced, and the distance between the cathode and the sample is further shortened.

Description

technical field [0001] The invention relates to the technical field of ultrafast electron diffraction, in particular to a flexible and compact hundreds-kilovolt ultrafast electron diffraction device. Background technique [0002] Ultrafast electron diffraction technology is a technology that uses ultrashort pulse laser to realize time-resolved pump detection. Its principle is to use a spectroscopic device to divide the laser pulse into two beams, and one beam is used to excite the cathode of the electron gun body to generate probe electrons. , the other beam pumps the reaction area, by controlling the optical path difference of the above two laser beams, the probe electrons are advanced or delayed to detect the reaction area, and then the measurement at different times is realized. [0003] With the development of time, ultrafast electron diffraction technology has been greatly developed, transmission diffraction, surface reflection diffraction, shadow imaging, ultrafast tra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20058G01N23/20008G01N23/20025
CPCG01N23/20008G01N23/20025G01N23/20058
Inventor 李玉同李梦超王瑄
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
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