Method for judging abnormal reasons of solar cell based on PL test

Abstract

The invention discloses a method for judging abnormal reasons of a solar cell based on PL test, which comprises the following steps of S1, vertically turning a silicon wafer subjected to wet etching through a turning windmill, horizontally outputting the silicon wafer through a blanking belt, selecting the silicon wafer on a specified pass, and directly carrying out double-sided coating passivation and printing sintering treatment to form a to-be-tested silicon wafer, and S2, performing PL test and judgment on the to-be-tested silicon wafer, and if a dark strip-shaped region appears in an image of the PL test, judging whether the dark strip-shaped region is a front roller mark of a wafer turning windmill or a wet etching blanking belt mark according to the direction of the dark strip-shaped region, thereby deducing a corresponding abnormal part. The method can achieve the quick recognition and judgment of the abnormal machine in a high-efficiency solar cell long-process production line, and reduces the abnormal time and the abnormal impact.

Description

technical field [0001] The invention relates to the technical field of solar cell detection, in particular to a method for judging the abnormal cause of a solar cell based on a PL test. Background technique [0002] At present, with the continuous deterioration of the environment and the increasing shortage of energy, strengthening environmental protection and developing clean energy has become a matter of great concern to all countries in the world. As an important photoelectric energy conversion device, the research of solar cells has attracted people's attention. With the development and utilization of new technologies, new processes and new structures of solar cells, the solar cell industry has developed rapidly. In order to promote the development of green energy faster, reducing the cost of solar cells and improving the conversion efficiency of cells has become the key to the development and competition of the industry. Two main goals. [0003] Under the production p...

AI Technical Summary

Problems solved by technology

However, in the solar cell production process, conventional PL testing methods cannot directly detect many types of wet etching abnormalities. For example, PL testing can only detect obvious conventional abnormalities such as watermarks, but cannot detect roller marks and feeding belts. Printing, etc.; or there are abnormalities in the PL test after the process, and there is no abnormality in the tracking to EL

The EL test of finished products is affected by the long process and time of high-efficiency battery manufacturing. It is necessary to complete the test and judgment of the faulty machine sample after the silicon wafer is made into a finished product. It cannot quickly confirm the problem and solve the analysis problem, and the detection efficiency is low.

Usually, after the EL test is used to detect an abnormality of a certain machine, it is repaired and restarted to test whether the repaired machine can operate normally. It still needs to wait for a new finished product to be made, and then use EL test again to confirm, which is time-consuming and labor-intensive. If there is still a fault in the detection, it needs to reciprocate

Images