A waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device

A technology of microwave dielectric materials and electromagnetic parameters, which is applied in the direction of measuring devices, magnetic performance measurement, magnetic measurement environment, etc., can solve the problems of insufficient development, etc., and achieve the effect of good conductivity and simple structure of the device

Active Publication Date: 2022-01-14
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
View PDF17 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the research on ultra-low temperature testing methods and technologies for the electromagnetic properties of electromagnetic wave absorption and electromagnetic wave shielding materials has not been fully developed.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device
  • A waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device
  • A waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] Such as figure 1 As shown, a waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device according to the present invention is designed by using the rectangular waveguide method test principle. A vacuum heat insulation chamber [3] is set around the outside of the nitrogen refrigeration chamber [2], and an insulation layer [4] of a certain thickness is arranged outside the vacuum insulation chamber [3]. The insulation layer [4] can be in any shape according to actual needs. The test section waveguide [1] has a rectangular cross-section inner cavity at the center and rectangular flanges at both ends. The measured microwave dielectric material [5] that can transmit microwaves is placed in the middle of the test section waveguide [1] inner cavity, and Separate the cavity of the test section waveguide [1] from the middle, and the cross-sectional size of the microwave dielectric material [5] to be tested should be slid...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of microwave testing, and in particular relates to a testing device for ultra-low temperature complex electromagnetic parameters of microwave dielectric materials by waveguide method. The test section waveguide with a rectangular cross section is set horizontally, the microwave dielectric material to be tested that can transmit microwaves is placed in the middle of the test section waveguide cavity, and the test section waveguide cavity is separated from the middle, and the two ends of the test section waveguide are respectively set There is a section of temperature-isolated waveguides of the same size: temperature-isolated waveguide 1 and temperature-isolated waveguide 2, the outer end of temperature-isolated waveguide 1 is provided with waveguide-coaxial converter 1, and the outer end of temperature-isolated waveguide 2 is provided with waveguide-coaxial converter 2 A liquid nitrogen refrigeration chamber is arranged around the outer side of the test section waveguide, a vacuum heat insulation chamber is arranged around the outer side of the liquid nitrogen refrigeration chamber, and an insulation layer is arranged outside the vacuum heat insulation chamber. The invention adopts the testing principle of the rectangular waveguide method, and can realize complex electromagnetic parameter testing of dielectric materials from room temperature to ultra-low temperature -165°C and below.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, and in particular relates to a testing device for ultra-low temperature complex electromagnetic parameters of microwave dielectric materials by waveguide method. Background technique [0002] Microwave refers to electromagnetic waves with very short wavelengths and high frequencies. It is an alternating electromagnetic field that exists in different media. In a broad sense, its frequency ranges from 300MHz to 3000GHz, that is, electromagnetic waves with wavelengths ranging from 1m to 0.1mm. Both can be called microwaves, but electromagnetic waves with a wavelength of less than 1cm to 0.1mm are usually called millimeter waves and submillimeter waves, while electromagnetic waves with a wavelength of more than 1cm to 1m are called microwaves, and the corresponding frequencies are 300MHz to 30GHz. [0003] In recent years, with the steady advancement of space station construction and lunar ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/12G01R33/00B01L7/02
CPCG01R33/1253G01R33/007B01L7/02
Inventor 张劲松孙家言李处森马嵩张志东
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products