Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Visible light-medium wave infrared dual-band common aperture optical system

An optical system and visible light technology, applied in optics, optical components, instruments, etc., can solve the problems of heavy weight and large volume of imaging system

Active Publication Date: 2021-01-05
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF25 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the existing dual-band imaging system, because the two bands are independent systems, resulting in the technical problems of large volume and heavy weight of the overall imaging system, the present invention provides a visible-medium-wave infrared dual-band common-aperture optical system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Visible light-medium wave infrared dual-band common aperture optical system
  • Visible light-medium wave infrared dual-band common aperture optical system
  • Visible light-medium wave infrared dual-band common aperture optical system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] The content of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0072] Such as figure 1 As shown, the visible light-medium-wave infrared dual-band common-aperture optical system includes a main reflector 01, a spectroscopic element 02, a visible light sub-system and a mid-wave infrared sub-system; the target light is reflected by the main reflector 01 to the spectroscopic element 02, and the spectroscopic element 02 is used to split the light into two beams, namely the visible light beam and the mid-wave infrared beam, and enter the visible light sub-system and the mid-wave infrared sub-system respectively. The visible light sub-system and the mid-wave infrared sub-system share the main reflector 01, the main reflector 01, the light splitting element 02 and the visible light sub-system constitute a visible light optical system, such as figure 2 and image 3 As shown; the main ref...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a visible light-medium wave infrared dual-band common aperture optical system, which solves the problems that a conventional dual-band imaging system is large in overall size and heavy in weight. The system comprises a main reflector, a light splitting element, a visible light subsystem and a medium wave infrared subsystem, the target light is reflected to the light splitting element through the main reflector, and the light splitting element is used for splitting the light into two paths which respectively enter the visible light subsystem and the medium wave infrared subsystem. The visible light subsystem comprises a first folding axis reflector, a second folding axis reflector, a primary image correction lens group, a collimating lens group and an objective lens group which are sequentially arranged along a light path; and the medium wave infrared subsystem comprises a medium wave infrared correction lens group, a fourth folding axis reflector and a projectionlens group which are sequentially arranged along a light path. The visible light subsystem and the medium wave infrared subsystem are divided into two paths in a mode of sharing the light splitting of the primary reflector and the secondary reflector, the visible light subsystem and the medium wave infrared subsystem are independently and synchronously imaged respectively, and the dual-band lenshas high imaging quality and completely meets the requirements of a system for target detection and imaging.

Description

technical field [0001] The invention relates to multi-band photoelectric imaging technology, in particular to a visible light-medium-wave infrared dual-band common-aperture optical system suitable for long-distance multi-spectral capture and tracking measurement in ground shooting ranges. Background technique [0002] With the continuous development of optoelectronic technology, the index requirements of shooting range measurement tasks are also getting higher and higher, and lightweight, generalization, modularization, high resolution, and all-day work have become the development direction. In order to achieve the characteristics of high resolution and all-day work, two imaging systems are usually designed independently to meet specific bands. Although they can meet the requirements of the measurement task, it will inevitably lead to the disadvantages of large volume and heavy weight of the system, especially for Medium and large aperture optical imaging system for long-dis...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G02B17/08
CPCG02B17/0804
Inventor 刘凯高昕段晶刘锋姜凯闫佩佩单秋莎
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products