Time domain reflection signal data acquisition method and device

A technology of signal data and time domain reflection, applied in the field of communication, can solve the problem of high cost and achieve the effects of accurate sampling points, increased accuracy and fast sampling speed

Active Publication Date: 2021-01-05
SHANDONG SENTER ELECTRONICS
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Problems solved by technology

[0005] The embodiment of the present application provides a time-domain reflection signal data acquisition method an

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  • Time domain reflection signal data acquisition method and device
  • Time domain reflection signal data acquisition method and device
  • Time domain reflection signal data acquisition method and device

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Embodiment Construction

[0030] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0031]The current time-domain reflection signal acquisition is sent to the high-speed ADC converter (Analog-to-Digital Converter) acquisition end after signal amplification and conditioning for real-time acquisition. According to the measurement accuracy requirements, the sampling frequency of the high-speed ADC converter needs to reach 100Mhz or even...

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Abstract

The invention discloses a time domain reflection signal data acquisition method and device, and aims at solving the problem that existing time domain reflection signal sampling equipment is high in cost. The method comprises the steps that a processor controls a gate array device to transmit pulse signals to a to-be-detected fault line, and the gate array device synchronously starts delay timing for sampling reflected signals corresponding to transmitted signals, wherein the transmitted signals are used for detecting a fault position of a to-be-detected fault line, the time delay is the timingstarting from the emission moment of the transmitted signals, the time delay duration of each time of sampling is different, when the time is delayed to a preset sampling time point, the gate array device sends Trig trigger signals to the low-speed ADC converter and the high-speed sampling holder so as to trigger the low-speed ADC converter to carry out single-point sampling on reflection signalsoutput by the high-speed sampling holder, and the sampling frequency is related to the transmitted signal emission frequency. According to the method, the low-speed ADC converter is adopted, and thepurposes of reducing the cost and achieving high-speed sampling are achieved by increasing the sampling time and times.

Description

technical field [0001] The present application relates to the technical field of communications, and in particular to a method and device for collecting time-domain reflection signal data. Background technique [0002] Time-Domain Reflectometry (TDR) is widely used in the fields of radar, cable obstacle test, and optical cable obstacle test. [0003] Existing time-domain reflection signal acquisition is sent to the acquisition end of a high-speed ADC (Analog-to-Digital Converter) converter after signal amplification and conditioning for real-time acquisition. According to the measurement accuracy requirements, the acquisition frequency of the high-speed ADC converter needs to reach 100Mhz or even higher. At present, it is also possible to increase the number of ADC converters and stagger the sampling time to achieve high-speed signal acquisition. The disadvantage of this method is that multiple ADC converters are required, the price will be high, and the control timing will...

Claims

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Application Information

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IPC IPC(8): G01R31/11G01R31/08
CPCG01R31/11G01R31/086
Inventor 刘在平李全用蔡富东文刚
Owner SHANDONG SENTER ELECTRONICS
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