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A clock tree quality detection method and device based on structure and timing

A quality inspection method and clock technology, which is applied in the direction of instruments, calculations, electrical digital data processing, etc., can solve the problems of unreliable clock tree quality inspection results, and achieve the effect of rapid quality inspection results

Active Publication Date: 2021-05-18
广芯微电子(广州)股份有限公司
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Problems solved by technology

[0004] The present invention provides a clock tree quality detection method and device based on structure and timing to solve the technical problem of unreliable detection results of clock tree quality in the prior art

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  • A clock tree quality detection method and device based on structure and timing
  • A clock tree quality detection method and device based on structure and timing
  • A clock tree quality detection method and device based on structure and timing

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Embodiment Construction

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0049] In the description of the present application, it should be understood that the terms "first" and "second" are used for description purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the present application, unless otherwise specified,...

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Abstract

The invention discloses a clock tree quality detection method and device based on structure and timing. The detection method includes: grabbing the fanout of the clock tree to be detected, and analyzing all the fanouts to obtain the actual parameters of the clock tree to be detected; The total number of leaf nodes of the clock tree to be tested and the preset number of fan-out constraints are calculated to obtain the theoretical parameters of the clock to be tested, and the actual parameters are compared with the theoretical parameters one by one. Check the quality check result of the clock tree. The invention provides a clock tree quality detection method and device based on structure and timing to solve the technical problem of unreliable detection results of the clock tree quality in the prior art.

Description

technical field [0001] The invention relates to the technical field of chip design, in particular to a clock tree quality detection method and device based on structure and timing. Background technique [0002] At present, the integrated circuit industry is booming. As the integration level of chips is getting higher and higher, and the chip area is getting larger and larger, it is becoming more and more difficult to converge the chip timing. The establishment of the most important clock tree for timing convergence has also become the focus of research and development in the industry. Major electronic design automation tool suppliers have developed many algorithms for clock trees to enhance and improve the quality of clock trees. However, in different processes and chip application directions, the establishment requirements and implementation methods of the clock tree are still diverse, and have a lot to do with the ideas and experiences of the engineers who use the tools. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/396
CPCG06F30/396
Inventor 王锐刘一杰莫军李建军王亚波
Owner 广芯微电子(广州)股份有限公司
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