Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measuring method, device, system and medium based on binocular microscopic vision

A microscopic vision and measurement method technology, applied in the field of visual measurement, can solve problems such as weak generalization ability, monotonous texture, and poor performance of microscopic scenes, and achieve the effects of high parallax matching accuracy, good accuracy and measurement accuracy

Active Publication Date: 2021-04-02
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are few methods for microscopic stereo matching, and most researchers directly apply the above macroscopic matching methods to microscopic matching.
However, the monotonous color and monotonous texture of the observation sample in the microscopic world lead to unsatisfactory results after the direct transfer method, and a more targeted microscopic stereo matching method is worthy of being proposed.
For example, the existing stereo matching method based on deep learning has weak generalization ability, and the microscopic scene is quite different from the traditional stereo matching scene, so the performance in the microscopic scene is poor.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring method, device, system and medium based on binocular microscopic vision
  • Measuring method, device, system and medium based on binocular microscopic vision
  • Measuring method, device, system and medium based on binocular microscopic vision

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0037]It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application discloses a measurement method, device, system and medium based on binocular microscopic vision. Constraint relationship, perform image correction to obtain the left and right images; down-sample the left and right images, perform stereo matching and matching point propagation on the pixels in the sampled image of the corresponding layer with the smallest resolution in the obtained left sampled image set, and perform layer-by-layer sampling and Stereo matching update and interpolation processing to obtain dense disparity results; then measure the object to be tested according to camera parameters and dense disparity results. The embodiment of the present application solves the problem of inapplicability and low accuracy of the measurement method on the macro scale in the prior art to the micro scale, and the measurement method provided is very suitable for binocular measurement in the micro scene, and can obtain good accuracy and precision of microscopic measurements.

Description

technical field [0001] The present application relates to the technical field of visual measurement, and in particular to a measurement method, device, system and medium based on binocular microscopic vision. Background technique [0002] Microscopic stereoscopic measurement technology is an important means for three-dimensional measurement and surface reconstruction of observed objects and exploration of the microscopic world. Typical methods of microscopic stereo measurement include defocus depth measurement, microscopic binocular imaging, laser scanning measurement, shadow shape acquisition, etc. Among them, microscopic binocular imaging is widely favored by workers in the fields of precision machining and failure analysis due to its advantages of simple and fast imaging, good robustness, and high precision. [0003] Microscopic binocular imaging measurement currently mainly relies on stereo microscopes (also known as dissecting microscopes, solid microscopes or stereo m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T7/33G06T7/55G06T5/00G06T7/80G06T3/40G06K9/46
CPCG06T7/0002G06T7/33G06T7/55G06T7/80G06T3/4023G06T2207/10061G06V10/462G06T5/80
Inventor 李嘉茂朱冬晨王贤舜张晓林
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products