Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for constructing convolutional neural network model for surface defect detection and application thereof

A convolutional neural network and defect detection technology, which is applied in the field of constructing a convolutional neural network model for surface defect detection, can solve problems such as time waste, random surface defect shapes, and difficulty in meeting production requirements, so as to improve the quality of the factory , Improve the effect of defect recognition rate

Pending Publication Date: 2020-08-25
慧泉智能科技(苏州)有限公司
View PDF3 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the complex surface texture of industrial products, the shape of surface defects is very random, the contrast is low, and the stability on the production line is also difficult to guarantee. The existing machine vision algorithms have great limitations in the process of analyzing defects. The rate is very high, it is difficult to meet the actual production requirements
Moreover, the existing machine vision algorithms need to constantly adjust and optimize the algorithm when facing various random defects, which has very poor adaptability and will also lead to a waste of time.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for constructing convolutional neural network model for surface defect detection and application thereof
  • Method for constructing convolutional neural network model for surface defect detection and application thereof
  • Method for constructing convolutional neural network model for surface defect detection and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] As mentioned above, in view of the deficiencies in the prior art, the inventor of this case was able to propose the technical solution of the present invention after long-term research and extensive practice. The technical solutions of the present invention will be clearly and completely described below, and obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] The technical solution adopted in the present invention comprises: the technical solution adopted in the present invention comprises: a kind of method for constructing the convolutional neural network model that is used for surface defect detection, and this method comprises the following steps:

[0029] (1) Collect and import original pictures...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for constructing a convolutional neural network model for surface defect detection and application thereof. The method comprises the following steps: (1) collecting and importing an original picture; (2) preprocessing the original picture, and determining the preprocessed original picture as an original training sample and storing the original training sample; (3)labeling the original training sample to generate a labeled sample; (4) transforming the original training sample to generate a new training sample, and enhancing the training sample; and (5) taking the training sample as input data, marking the sample, carrying out corresponding processing, and taking the processed sample as reference output: after the convolutional neural network model is generated, storing the convolutional neural network model until the stable convergence accuracy is achieved through multiple iterations. According to the method, various adverse effects caused by interference factors such as random product defect form, complex texture and low contrast ratio under the condition that a small number of samples are input are overcome, so that the defect recognition rate isimproved.

Description

technical field [0001] The technical field of image detection of the present invention particularly relates to a method for constructing a convolutional neural network model for surface defect detection and its utilization. Background technique [0002] Usually, the surface of industrial products will have defects such as cracks, dirt, impurities, and lack of appearance due to various factors in the production process. Traditional production lines use manual online judgment, but manual work is also limited by fatigue and human eyes. etc. lead to a decline in product yield, affect the quality of shipments, and fail to meet the requirements of end users. [0003] In recent years, some system integrators have adopted machine vision methods to detect surface defects of industrial products. First, image the surface defects of the magnetic circuit through a special optical path to obtain defect information on the product surface, and then use morphological processing, geometric an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G01N21/88
CPCG01N21/8851G01N2021/8887G06F18/214G06F18/241
Inventor 黄猛何航
Owner 慧泉智能科技(苏州)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products