Probe and connector suitable for large-current high-speed signal testing

Abstract

The invention discloses a probe and a connector suitable for a large-current high-speed signal testing. The probe comprises a first contact part, a first elastic part, a connecting part, a second elastic part and a second contact part, the first elastic part comprises a first linear part, a first bent part and a second linear part; the first linear part extends in the direction perpendicular to the axial direction, and one end of the first linear part is connected with the other end of the first contact part; the second linear part extends in the direction perpendicular to the axial direction,and one end of the second linear part is connected with the connecting part; the first bending part is of a C-like structure, one end of the first bending part is connected with the first linear part, and the other end is connected with the second linear part; the distance between the first linear part and the second linear part is smaller than the maximum inner diameter of the first bent part inthe axial direction; the connecting part is used for connecting the second linear part and the second elastic part; according to the probe provided by the invention, the elastic force of the elasticpart can be reduced while the cross sectional area is increased, and the probe and a contact object thereof are prevented from being damaged due to overlarge elastic force / clamping force.

Description

technical field [0001] The invention belongs to the technical field of signal transmission and testing, and more specifically relates to an elastic flat probe and a connector used on testing equipment suitable for high-speed signal transmission and high-current testing environments. Background technique [0002] In the manufacturing process of electronic components such as liquid crystal panels and integrated circuits, it is necessary to conduct conduction detection and operational characteristic inspection of the product. The specific detection method is to use a probe to connect the FPC contact electrode connected to the main substrate of the electronic component module or the installed These inspections are performed by connecting electrode parts such as board-to-board connectors to an inspection device. [0003] Probes commonly used at present have a pair of contacts capable of respectively contacting an electrode terminal of an electronic component and an electrode term...

AI Technical Summary

Problems solved by technology

[0005] Aiming at at least one defect or improvement requirement of the prior art, the present invention provides a probe and connector suitable for high-current and high-speed signal testing. The probe is too elastic due to the passage path, which is easy to damage the probe and the problem of contacting the object

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