Method for testing all performance parameters of EMCCD chip based on Labview

Abstract

The invention discloses a method for testing all performance parameters of an EMCCD chip based on Labview. A test system of the method is composed of an integrating sphere light source with continuously adjustable light intensity, a low-light illuminometer, a grating monochromator, a camera obscura, an electronic control box and an NI professional industrial personal computer. Based on a Labview platform, control of each component of the test system, test environment information recording and performance parameter algorithm calculation are combined together. 15 parameters including blind pixelrate, charge-voltage conversion factor, charge transfer efficiency, quantum efficiency, spectral response rate, detection sensitivity, dynamic range, readout noise, full well charge, dark signal, dark signal non-uniformity, photon response non-uniformity, gain multiple, noise factor and multiplication equivalent readout noise are tested; not only can the test performance of the EMCCD chip be completely evaluated, but also the test time is greatly shortened, and the requirements of test personnel on the basic knowledge of the EMCCD are reduced; the test result is accurate and reliable, the test process is convenient and fast, and the tester burden is small.

Description

technical field [0001] The invention belongs to the technical field of photodetector testing, in particular to a method for testing full performance parameters of an EMCCD chip based on Labview. Background technique [0002] As a new type of all-solid-state low-light imaging device, electron multiplication CCD (Electron Multiplication Charge Coupled Device, EMCCD) has the advantages of small size, long life, high quantum efficiency, low power consumption, and high sensitivity compared with traditional low-light imaging devices. The field of low-light imaging has great development potential and application prospects. Accurately testing the performance parameters of EMCCD is of great significance to the design of high-performance EMCCD cameras. [0003] The performance parameters of EMCCD mainly include: blind cell rate, charge-voltage conversion factor, charge transfer efficiency, quantum efficiency, spectral responsivity, detection sensitivity, dynamic range, readout noise,...

AI Technical Summary

Problems solved by technology

In the national military standard GJB7951-2012 "Charge-coupled imaging device test method" (implemented in 2013), a number of performance parameter test methods for ordinary CCD chips are specified, but it does not include EMCCD characteristic performance parameters, such as multiplication gain and noise. factors, etc., it is also impossible to use the ordinary CCD chip performance parameter test method to test the characteristic performance parameters of the EMCCD imaging system, and its performance parameters cannot evaluate the real performance of the EMCCD chip

[0005] At present, the existing test systems and methods are only aimed at ordinary CCD chips, and these methods are not suitable for the performance evaluation of EMCCD

However, the test system and method for EMCCD are not complete, and a single characteristic parameter cannot effectively evaluate the performance of the chip.

If an ordinary CCD test system is used to test the EMCCD, and the characteristic parameters of the EMCCD are added to the ordinary CCD parameter test for a separate test, then not only the accuracy and reliability of the EMCCD performance parameter evaluation will be affected, but also the full parameters of the EMCCD will be affected. The testing process will become very lengthy, requiring testers to spend a lot of time and effort to familiarize themselves with the testing methods, and spend a lot of time to complete the entire testing process

Therefore, there is currently no testing technology that can efficiently and completely evaluate the performance of EMCCD chips

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