C language defect detection method and device based on multi-level analysis

Abstract

The embodiment of the invention discloses a C language defect detection method and device based on multi-level analysis. The method comprises the following steps: calculating pointer pointing information of each function in the function call relation graph based on a path-sensitive pointer analysis method; performing inter-process analysis on a calling function corresponding to a function callingstatement in the function calling relational graph to obtain abstract information of the calling function; aiming at each node in the control flow graph, determining a control dependence correspondingrelation and a data dependence corresponding relation corresponding to the node; and generating a value flow graph according to the pointer pointing information of each function, the abstract information of the calling function, the control dependence corresponding relation corresponding to each node and the data dependence corresponding relation, and performing defect detection on the to-be-detected C language program according to the value flow graph to obtain a detection result. By applying the scheme provided by the embodiment of the invention, the accuracy and efficiency of defect detection can be considered.

Description

technical field [0001] The invention relates to the technical field of defect detection, in particular to a C language defect detection method and device based on multi-level analysis. Background technique [0002] At present, for the defects existing in the C language program, the method of static analysis is usually used for defect detection. [0003] As the C language program becomes more and more perfect, the amount of code contained in the C language program is increasing. For example, the code amount of the Windows operating system in 2003 is more than ten times that of 1993, resulting in such a complex In the operating system, defects tend to become more complex. For example, defects may need to be called across multiple functions, which makes defect detection more difficult, and cannot take into account the accuracy and efficiency of defect detection. Therefore, there is an urgent need for a A defect detection method that can balance the accuracy and efficiency of d...

AI Technical Summary

Problems solved by technology

[0003] As the C language program becomes more and more perfect, the amount of code contained in the C language program is increasing. For example, the code amount of the Windows operating system in 2003 is more than ten times that of 1993, resulting in such a complex In the operating system, defects tend to become more complex. For example, defects may need to be called across multiple functions, which makes defect detection more difficult, and cannot take into account the accuracy and efficiency of defect detection. Therefore, there is an urgent need for a A defect detection method that can balance the accuracy and efficiency of defect detection

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