Planar electrical capacitance tomography imaging system and detection method

Abstract

The invention discloses a planar electrical capacitance tomography imaging system and a detection method. The electrical capacitance tomography imaging system comprises an upper computer, a single chip microcomputer, a capacitance measurement circuit, a switching circuit, and an array type capacitive sensor, wherein the single chip microcomputer is connected with the upper computer, the capacitance measurement circuit and the switching circuit separately; the switching circuit is connected with the array type capacitive sensor and the capacitance measurement circuit separately; the single chipmicrocomputer controls the switching circuit to perform electrode switch on the array type capacitive sensor so as to realize capacitive coupling between different electrodes, so that the capacitancemeasurement circuit can be used for measuring; data of the capacitance measurement circuit is transmitted to the single chip microcomputer in a single direction, the single chip microcomputer collects data and then is communicated with a data collection communication system of the upper computer so as to transmit the data to a computer, then an image reconstruction system processes and reconstructs data. The electrical capacitance tomography imaging system has a simple structure, is low in cost, and realizes large-area rapid detection, so as to rapidly detect and position a defect.

Description

technical field [0001] The invention belongs to the technical field of non-destructive testing, and relates to a non-destructive testing system and method based on capacitance tomography technology. Background technique [0002] Electric capacitance tomography technology was originally a non-destructive testing technology for detecting multiphase flow in pipelines. It reconstructs and analyzes the multiphase flow inside pipelines by setting multiple electrodes on the outside of pipelines for capacitance measurement. However, with the development of technology, the sensor structure began to change, from the earliest 8 electrodes to various sensors, to the current three-dimensional tomography sensor and planar sensor. And its detection object has also changed from multiphase flow to other non-metallic substances. Due to the characteristics of its electrodes, it has a certain detection ability for defects and damages deep in the material, which can make up for some other non-de...

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problem that the internal defects of the material are deep and it is inconvenient to use other detection methods, the present invention provides a planar electrical capacitance tomography system and detection method

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