Fast test function self-checking circuit and method for integrated circuit multi-parameter tester

Abstract

The invention provides a fast test function self-checking circuit and method for an integrated circuit multi-parameter tester. The fast test function self-checking circuit comprises a channel matrix,a signal analysis module and a plurality of test ports; the channel matrix is adaptively connected with the test ports and used for selecting one test port to construct a corresponding self-checking channel; the signal analysis module is in communication connection with the channel matrix and is used for self-checking the normality of key characteristics of a signal generation and excitation functional circuit according to the self-checking channel constructed by the channel matrix; the signal generation and excitation functional circuit which passes through self-checking conducts test verification on the normality of key characteristics of a configured signal receiving and analyzing functional circuit. By means of the fast test function self-checking circuit and method, test function verification of the multipath transceiving channel can be cooperatively completed without using external standard test instrument equipment, and the self-checking method is convenient, economical, high intest and application efficiency, capable of adapting to on-site fast self-checking verification of different configuration instrument states on the basis of supporting a test scale and high in versatility.

Description

technical field [0001] The present disclosure relates to the technical field of microwave testing, in particular to a rapid self-inspection circuit and method for a test function of an integrated circuit multi-parameter tester and a multi-parameter tester. Background technique [0002] The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art. [0003] With the industrialization and development of microwave semiconductor devices (integrated circuits), the demand and application scale of microwave semiconductor device multi-parameter testers are increasing. At the same time, the functional integration, testing and application scale of microwave semiconductor device multi-parameter test and efficiency requirements are getting higher and higher. In order to effectively solve the problem of simple, economical and efficient test function self-inspection of microwave semiconductor device mul...

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Problems solved by technology

[0006] In order to solve the deficiencies in the prior art, the present disclosure provides a circuit and method for rapid self-inspection of the test function of an integrated circuit multi-parameter tester, which realizes the rapid self-inspection of the test function of a multi-parameter tester for microwave semiconductor devices, and completes multiple tests at one time. It can effectively solve the problems of low test efficiency, high resource occupation cost and complicated operation process based on the traditional self-test method, and provide simple, economical and high-efficiency tests in a generalized way within the scope of the supported test scale. The test function of the self-test solution

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