Wireless test method for clock frequency of identification tag chip

A technology for clock frequency and wireless testing, which is applied in near-field transmission systems, read/write/query/recognition near-field transmission systems, electrical components, etc. in radio frequency identification systems. and other issues to achieve accurate and effective test results, more accurate test results, and reduced chip area

Active Publication Date: 2021-07-20
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

First of all, the traditional wireless test method ignores the influence of the algorithm. For example, in some cases, when the frequency of the tag reflected signal is 640KHz, the clock is divided by two or four instead of three, which leads to the test results appearing big error
Secondly, the traditional wireless test method has no way to test the dynamically adjusted clock frequency

Method used

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  • Wireless test method for clock frequency of identification tag chip
  • Wireless test method for clock frequency of identification tag chip
  • Wireless test method for clock frequency of identification tag chip

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0053] The reader is an NI device, the model is PXIe-1062Q. This device can realize traversal and send TRcal of different lengths, and can test the frequency value BLF_test of the signal returned by the tag.

[0054] The reader-writer antenna adopts a circularly polarized antenna, and is connected to the reader-writer through a wired cable.

[0055]The test samples provided in this embodiment are one single-clock algorithm chip and one five-clock algorithm chip, both chips are packaged with antennas to form a single-clock algorithm label and a five-clock algorithm label.

Embodiment 1

[0056] Embodiment 1, single clock algorithm chip clock test.

[0057] The chip clock is CLK1, and the number of clocks is n=1. The algorithm for calculating the BLF of the known chip is BLF_cal=f1(TRcal, DR, CLK1), and the formula f1 includes the influence of the internal sampling clock of the chip and the asynchronous transmission signal of the reader.

[0058] Use NIPXIe-1062Q to transmit Query commands with different TRcal lengths, and test the average frequency value of the returned signal. The test condition is DR==8, and the total test count=507 times.

[0059]

[0060]

[0061] The above is part of the data obtained from the test, and the total data has 507 rows.

[0062] The known function is BLF_cal=f1(TRcal, DR, CLK1), and the following formula can be listed according to the f1 function. According to the parameter traversal method, the following equations can be listed.

[0063] [BLF_test–f1(TRcal,DR,CLK1)]^2=Delta

[0064] Put the data obtained from the tes...

Embodiment 2

[0079] Embodiment 2, five-clock algorithm chip clock test.

[0080] The chip clocks are CLK1, CLK2, CLK3, CLK4, CLK5, and the number of clocks is n=5. It is known that the chip calculates the BLF algorithm as BLF_cal=f2(TRcal, DR, CLK1, CLK2, CLK3, CLK4, CLK5). The formula f2 includes the impact of the chip's internal sampling clock and the asynchronous signal emitted by the reader.

[0081] Use NIPXIe-1062Q to transmit Query commands with different TRcal lengths, and test the average frequency value of the returned signal. The test condition is DR==64 / 3, and the total test count=507 times.

[0082]

[0083]

[0084] The above is part of the data obtained from the test, and the total data has 507 rows.

[0085] The known function is BLF_cal=f2(TRcal, DR, CLK1, CLK2, CLK3, CLK4, CLK5), and the following formula can be listed according to the f2 function. According to the parameter traversal method, the following equations can be listed.

[0086] [BLF_test–f2(TRcal,DR,C...

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PUM

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Abstract

The invention discloses a wireless testing method for the clock frequency of an identity identification tag chip, comprising: a reader-writer sends a query command of TRcal continuously changing to the tag to be tested through a read-write antenna for testing; For multiple signals returned by the tag, calculate the frequency mean BLF_test of multiple signals, and record the values ​​​​of the three arrays of DR, TRcal, and BLF_test obtained for each test, and the length of each array is equal to the number of times count of the test; the column function relationship One: BLF_test=f(TRcal, DR, CLK1, CLK2, ... CLKi ..., CLKn), and count>n, where CLK1-CLKn is the clock frequency inside the clock. Thereby, the wireless testing method for the clock frequency of the identification tag chip of the present invention has low cost and more accurate test results.

Description

technical field [0001] The invention relates to the technical field of chip and UHF RFID wireless testing, in particular to a wireless testing method for the clock frequency of an identification tag chip. Background technique [0002] UHF RFID technology is a wireless communication technology used in identification and other aspects, and is one of the key technologies of the Internet of Things. [0003] The wireless communication method of UHF RFID is that firstly, the reader-writer transmits a wireless command signal containing command parameters to the tag, and then the reader-writer transmits a continuous wave. During the continuous wave emission stage of the reader, the tag reflects the continuous wave emitted by the reader into two different state signals to the reader through the backscattering mechanism according to the command parameters of the reader. The reader can identify the wireless signals of these two states, so as to realize the wireless communication betwe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B5/00H04B17/15
CPCH04B5/0043H04B5/0062H04B17/15
Inventor 陈会军张喆李德建胡毅马岩唐晓柯甘杰谭浪
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY
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