Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for manufacturing microscopic speckle in digital image correlation method by using femtosecond laser

A femtosecond laser and digital image technology, used in laser welding equipment, manufacturing tools, welding equipment, etc., can solve the problems of large influence of speckle surface properties, change of physical and chemical properties, large speckle, etc., and achieve the diameter of speckle. and density controllable, high repeatability, good uniformity

Inactive Publication Date: 2019-09-17
TSINGHUA UNIV
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the above common artificial speckle production methods all have certain problems: the speckle obtained by the artificial painting method is relatively large, and the smallest size is sub-millimeter level, which cannot meet the measurement requirements of small deformations, and will oxidize or even fall off at high temperatures ; The speckle prepared by chemical vapor deposition is greatly affected by the surface properties of the sample to be produced, and the preparation process may change the physical and chemical properties of the surface of the sample to be produced; the speckle prepared by nanoparticle spraying is also affected by the surface properties of the sample to be produced. and poor repeatability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for manufacturing microscopic speckle in digital image correlation method by using femtosecond laser
  • Method and system for manufacturing microscopic speckle in digital image correlation method by using femtosecond laser
  • Method and system for manufacturing microscopic speckle in digital image correlation method by using femtosecond laser

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] (1) Clean the surface of the sample to be made with absolute ethanol, and dry it, select the sample to be made as the Fe-Ni plate weld, and the size of the sample to be made is 12mm×10mm×3mm (length×width×thickness) );

[0029] (2) According to the requirements, determine that the diameter of the microscopic speckle to be produced is 1 μm, the speckle field is a rectangular array, and the pitch is 10 μm, and the ideal speckle field is drawn as figure 2 , and generate a microscopic speckle field according to the determined speckle diameter, speckle density and speckle field type, and obtain the motion trajectory of the three-dimensional workbench according to the coordinates of the microscopic speckle in the microscopic speckle field;

[0030] (3) The femtosecond laser beam is incident on the sample to be produced, and the sample to be produced is placed on the three-dimensional workbench, so that the three-dimensional workbench moves according to the motion track of st...

Embodiment 2

[0033] (1) Clean the surface of the sample to be made with absolute ethanol, and dry it, select the sample to be made as a Si sheet, and the size of the sample to be made is 10mm×10mm×1mm (length×width×thick);

[0034] (2) According to the requirements, the microscopic speckle diameter is selected as 1 μm, the microscopic speckle field is a rectangular array, and the microscopic speckle spacing is 10 μm, and the microscopic speckle field is generated according to the determined speckle diameter, speckle density and speckle field type , according to the coordinates of the microscopic speckle in the microscopic speckle field, the motion trajectory of the three-dimensional workbench is obtained;

[0035] (3) The femtosecond laser beam is incident on the sample to be produced, and the sample to be produced is placed on the three-dimensional workbench, so that the three-dimensional workbench moves according to the motion track of step (2), and the production of the microscopic speck...

Embodiment 3

[0038] (1) Clean the surface of the sample to be made with absolute ethanol, and dry it, select the sample to be made as a Cu plate, and the size of the sample to be made is 10mm×1mm (diameter×thick);

[0039] (2) According to the requirements, the microscopic speckle diameter is selected as 1 μm, the microscopic speckle field is a rectangular array, and the microscopic speckle spacing is 10 μm, and the microscopic speckle field is generated according to the determined speckle diameter, speckle density and speckle field type , according to the coordinates of the microscopic speckle in the microscopic speckle field, the motion trajectory of the three-dimensional workbench is obtained;

[0040] (3) The femtosecond laser beam is incident on the sample to be produced, and the sample to be produced is placed on the three-dimensional workbench, so that the three-dimensional workbench moves according to the motion track of step (2), and the production of the microscopic speckle on the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
Login to View More

Abstract

The invention relates to a method and system for manufacturing microscopic speckle in a digital image correlation method by using a femtosecond laser, and belongs to the technical field of micro-deformation measurement. The microscopic speckle is etched on the surface of a sample to be manufactured by using a femtosecond laser; the etched microscopic speckle moves along with deformation of the sample to be manufactured, and can serve as an information carrier for digital image correlation measurement, so that the displacement, strain and other information of the sample to be manufactured under the load can be measured. The etched microscopic speckle can reach the micron scale and is suitable for measuring microdeformation, the etching depth does not exceed 2 microns, the influence on the performance of the to-be-manufactured sample is small, the microscopic speckle can not loss effect under high-temperature, the method is suitable for most materials such as metal materials, ceramic materials, organic materials, composite materials and the like, the etching process is automatically controlled, and the efficiency is high.

Description

technical field [0001] The invention relates to a method and a system for producing microscopic speckle in a digital image correlation method with a femtosecond laser, and belongs to the technical field of microscopic deformation measurement. Background technique [0002] With the development of manufacturing technology, in order to obtain more detailed performance indicators of components and materials and improve the manufacturing level, it is required to be able to measure the deformation of micro-nano scale. As a non-contact optical measurement, digital image correlation measurement hardly affects the properties of the sample to be produced. It has the characteristics of full-field measurement and can comprehensively obtain information such as displacement and strain of components and materials. It is widely used in measurement. [0003] Digital image correlation determines the deformation characteristics of the sample to be produced by analyzing the correlation of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B23K26/362B23K26/60B23K26/70
CPCB23K26/362B23K26/60B23K26/70
Inventor 闫剑锋蔡志鹏李克俭谢家旺张宇
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com