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High-frequency polishing quartz wafer with long H-shaped structure

A quartz wafer and wafer technology, applied in the field of communication, can solve the problems of chip damage, the overlapping area cannot be cleaned, the crystal resonator DLD2 parameter is large, etc., and the effect of preventing the cleaning from being unclean is achieved.

Pending Publication Date: 2019-09-10
CHENGDU TIMEMAKER CRYSTAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] As the wafer becomes thinner and thinner, its surface roughness is low, resulting in lamination of the wafer during the cleaning process
Once the two wafers are stacked together, a vacuum area appears due to the very smooth surface, resulting in the overlapping area cannot be cleaned, resulting in excessive crystal resonator DLD2 (level-dependent characteristics) parameters; if forcibly separated, the wafer will be damaged

Method used

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  • High-frequency polishing quartz wafer with long H-shaped structure
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  • High-frequency polishing quartz wafer with long H-shaped structure

Examples

Experimental program
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Effect test

Embodiment 1

[0036] A high-frequency polished quartz wafer with a long H-shaped structure provided by a preferred embodiment of the present invention, the web wafer 1 is set as the original wafer in the present invention, when the length, width and height of the web wafer 1 are respectively 1.35mm, 0.93mm and 0.017 mm, the ANSYS finite element software is used to calculate the amplitude-frequency characteristics and impedance characteristics of the crystal vibration of the original wafer under the excitation of the alternating electric field through harmonic response analysis; the impedance value is 40Ω.

Embodiment 2

[0038] In this embodiment, on the basis of Embodiment 1, the length of the flange plate wafer 2 is 1.35mm, and the width and height are variables; the length, width and height of the web wafer 1 are 1.35mm, 0.93mm and 0.017mm respectively; Calculate the amplitude-frequency characteristics and impedance characteristics of the crystal vibration under the excitation of the alternating electric field for the long H-shaped quartz wafer; obtain the impedance value, as shown in Table 1.

[0039] Table 1

[0040]

[0041] As can be seen from Table 1, the size of the long H-shaped quartz wafer is as shown above. Compared with the impedance value of the original wafer, it can be found that as the size of the flange plate Y2 increases, it means that the length / width of the overall structural size of the long H-shaped quartz wafer Ratio decreases, crystal vibration is suppressed, so its impedance will increase; on the contrary, as the size of the flange plate Z2 increases, the terminal...

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Abstract

The invention discloses a high-frequency polishing quartz wafer with a long H-shaped structure. The high-frequency polishing quartz wafer comprises a rectangular web wafer and two rectangular flange plate wafers, wherein the flange plate wafers are symmetrically arranged on two opposite long side edges of the web wafers to form an H-shaped steel quartz wafer; wherein the length, width and height of the web wafer are respectively X1, Y1 and Z1; the lengths, widths and heights of the flange plate wafers are X2, Y2 and Z2 respectively; wherein X2 is equal to X1; 1.12Z1<=Y2<=1.47Z2; and Z2 is greater than or equal to 0.005Y1 and less than or equal to 0.027Y1. According to the scheme, the piezoelectric quartz crystal frequency piece with the integrated novel structure is processed in a photoetching corrosion manner; according to the appearance and the size of the phase, a simulation result shows that bending vibration and surface shear vibration in the direction can be better restrained byadding frame loading in the width direction, and therefore it is guaranteed that the amplitude of resonance is large enough, and the amplitude of impedance is reduced.

Description

technical field [0001] The invention belongs to the communication field and relates to a high-frequency polished quartz wafer with a long H-shaped structure. Background technique [0002] With the development of 5G communication, the wavelength of communication is getting shorter and shorter, and its communication frequency is getting higher and higher accordingly; the core component of an AT-cut quartz crystal resonator or oscillator is a piezoelectric quartz crystal frequency plate, and its thickness is the same as The resonant frequency satisfies: t=1664 / f (wherein t represents the thickness of the wafer; f represents the frequency of the wafer), by which it can be clearly found that as the resonant frequency of the wafer increases, the thickness of the wafer becomes thinner and thinner . In addition, in order to reduce the impedance of the high-frequency quartz wafer, it is often achieved by changing the surface roughness of the wafer to reduce its resonance damping. T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03H9/19H03H3/02G06F17/50
CPCH03H9/19H03H3/02G06F30/23
Inventor 李辉叶竹之
Owner CHENGDU TIMEMAKER CRYSTAL TECH
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