Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method for testing the modulation transfer function of a character-shaped linear infrared detector

A modulation transfer function, infrared detector technology, used in optical instrument testing, machine/structural component testing, testing optical performance, etc., can solve problems such as inapplicability, achieve accurate test results representation, reduce positioning time, and reduce testing. effect of time

Active Publication Date: 2021-01-05
SHAOXING UNIVERSITY
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the above-mentioned existing testing methods are not suitable for MTF testing of character-shaped linear infrared detectors, the present invention provides a method for testing the modulation transfer function of character-shaped linear infrared detectors with fast test speed and high accuracy. The method adopts the following technical solutions to realize:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for testing the modulation transfer function of a character-shaped linear infrared detector
  • A method for testing the modulation transfer function of a character-shaped linear infrared detector
  • A method for testing the modulation transfer function of a character-shaped linear infrared detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] The test structure and test method of the present embodiment are as figure 1 with figure 2 As shown, the modulation transfer function (hereinafter referred to as MTF) of a non-standard character-shaped linear mercury cadmium telluride infrared detector is mainly tested. First, a hardware system for testing needs to be built, which is a temperature-controllable surface source The blackbody is placed before the imaging target roulette, and the temperature of the blackbody is adjusted to irradiate the target. The target used in this embodiment is different from the half-moon-shaped target in the prior art, but a V-shaped target 1, which is imaged after irradiation. The image is emitted in parallel by the mirror in the parallel light pipe. Encapsulate the character-shaped linear mercury cadmium telluride infrared detector 2 in the Dewar, and install the focusing infrared lens in front of the Dewar window, and place the whole assembly (Dewar and infrared lens) on a movable...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an MTF test method of a character-shaped linear infrared detector. A black body is used to irradiate a V-shaped target to obtain infrared imaging, and the character-shaped linear infrared detector packaged in a Dewar is moved to complete focusing and the edge of the target. The rapid positioning of the two columns of pixels of the image and character infrared detector, and then the output data of the two columns of pixels are arranged and combined to obtain the ESF, and the algorithm is used to eliminate the invalid response output pixels, so that the calculation of the inclination angle is more accurate and thus Effectively improve the test accuracy of the MTF of linear devices, and finally calculate the MTF of character-shaped linear devices, and use the MTF value at the Nyquist frequency of the device as the final characterization value of the device. The present invention can quickly and accurately locate the edge of the character-shaped line array device and the V-shaped target image, and the test speed is fast, and the test accuracy is improved by eliminating invalid response pixels of the line array; MTF test of array and non-standard font linear infrared devices.

Description

Technical field: [0001] The invention relates to a method for testing the modulation transfer function of an infrared detector, in particular to a method for testing the modulation transfer function of a character-shaped line array infrared detector, and belongs to the technical field of infrared photoelectric testing. Background technique: [0002] The modulation transfer function (MTF) is an important connection parameter connecting the preparation of infrared devices and the subsequent application of the whole machine. Its value directly reflects the modulation transfer performance of infrared devices to space targets and the spatial resolution of device imaging. It is an international standard for measuring infrared An important parameter of device imaging quality. When infrared detectors are used in important occasions such as aerospace, MTF parameters have become a key index parameter, and how to accurately measure the MTF value of infrared devices has become a researc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/00
Inventor 张瞳卢雪萍
Owner SHAOXING UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com