Substrate inspection device and substrate inspection method
A substrate inspection and substrate technology, applied in measurement devices, optical devices, instruments, etc., can solve the problems of thickness measurement errors, difficulty in realizing OCT miniaturization, etc., and achieve the effect of reducing measurement errors and shortening the time required for measurement
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[0039] Various embodiments described herein are given for the purpose of clearly explaining the technical idea of the present disclosure, and are not intended to be limited to specific embodiments. The technical idea of the present disclosure includes various modifications (modifications), equivalents (equivalents), alternatives (alternatives) of the embodiments described herein, and embodiments in which all or a part of the embodiments are selectively combined. In addition, the scope of rights of the technical thought of this disclosure is not limited to the various examples presented below or the specific description thereof.
[0040] Including technical or scientific terms, as long as they are not defined differently, the terms used herein may have the meanings generally understood by those of ordinary skill in the art to which the present disclosure belongs.
[0041] Expressions such as "comprising", "may include", "have", "may have", "has", "may have" etc. as used her...
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