Measurement device and method for residual capacity after lambda-DNA neutralization
A technology for measuring device and remaining power, applied in the direction of measuring device, measuring electrical variables, instruments, etc., can solve the problems of low accuracy of measurement results and inconvenient measurement
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0066] When λ-DNA is condensed in the spermine (spermine) solution with a concentration of 0.5mM,
[0067] Known electric current I=488 μ A, spermine (spermine) solution resistivity σ=647 μ S / cm, the cross-section D=8×10 of groove -6 m 2 ,
[0068] The stretching length of λ-DNA L=11.44μm and the deflection distance δ can be measured by real-time analysis software x =0.42μm, the corresponding F 磁 =0.95PN, get:
[0069]
[0070] ∴tanθ=0.036
[0071]
[0072] ∴F 电 =F 磁 tanθ=0.95×0.036=0.034PN
[0073]
[0074]
[0075] It is known that the charge amount of the elementary charge is 1.6×10 -19 c,
[0076] ∴ charge (indivual)
Embodiment 2
[0078] When λ-DNA is condensed in NaCl solution with a concentration of 10mM,
[0079] Known current I=980μA, NaCl solution resistivity σ=1665μS / cm, slotted cross-section D=8×10 -6 m 2 ,
[0080] The stretching length of λ-DNA L=14.85μm and the deflection distance δ can be measured by real-time analysis software x =0.3 μm, the corresponding F 磁 =1.34PN, get:
[0081]
[0082] ∴tanθ=0.02
[0083]
[0084] ∴F 电 =F 磁 tanθ=1.34×0.02=0.0268PN
[0085]
[0086]
[0087] It is known that the charge amount of the elementary charge is 1.6×10 -19 c,
[0088] ∴ charge (indivual).
PUM
Property | Measurement | Unit |
---|---|---|
Tensile length | aaaaa | aaaaa |
Tensile length | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com