Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Testing device for operating system of security chip

A security chip, operating system technology, applied in software testing/debugging, instruments, general-purpose stored program computers, etc., can solve the problems of VC without UI control operation interface, inconvenient test execution process, and long time to get started, etc. Save development script time, improve test efficiency, and simple syntax

Pending Publication Date: 2019-06-21
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +2
View PDF2 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Although traditional language programs have long-term development experience and are relatively proficient and handy in building test frameworks and developing test scripts, they have their own problems and limitations for the test tasks themselves.
If VC is a static language, you need to declare its data type before using any variable, and you need to write a very detailed implementation process before implementing the test function, that is to say, you need to complete many lines of code to achieve it. At the same time, for novices, It takes a relatively long time to get started, and it will be a big bottleneck when encountering compilation or linking problems; on the other hand, VC does not have a corresponding intuitive UI control interface, which is inconvenient during test execution
And VB has ready-made controls and modules in the UI control interface, but there are many problems in the VB software itself, such as the readability of the code, the script execution rate is relatively poor, and VB is a relatively outdated language software, the main The test methods are all done manually, and the test efficiency is relatively low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing device for operating system of security chip
  • Testing device for operating system of security chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The specific embodiments of the present invention will be described in detail below in conjunction with the drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0021] Unless otherwise expressly stated otherwise, throughout the specification and claims, the term "comprising" or its transformations such as "including" or "including" will be understood to include the stated elements or components, and not Other elements or other components are not excluded.

[0022] In order to overcome and reduce the problems caused by traditional programming languages ​​in script test execution, the present invention proposes a security chip operating system test device, which is a COS test platform built and developed based on the python language. As a high-level programming language, python is simple and easy to understand. Although it is written in C language, it abandons very complicated pointers and simpli...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a testing device for a security chip operating system, which is constructed through Python language and comprises a PCSC communication interface layer, an algorithm library interface layer, a function instruction interface layer, a basic algorithm interface layer and a script writing and executing layer. And communication with the to-be-tested security chip is realized through the PCSC communication interface layer. And the algorithm library interface layer is used for packaging interfaces of various security algorithms applied by the to-be-tested security chip. And thefunction instruction interface layer is used for packaging a function instruction in an operating system of the to-be-tested security chip. And the basic algorithm interface layer is used for performing secondary combination and packaging on the interface of the algorithm library interface layer and newly adding an operation function. The script writing and executing layer is used for storing, executing and modifying test scripts, and the script writing and executing layer achieves testing by combining and calling the PCSC communication interface layer, the algorithm library interface layer,the function instruction interface layer and the basic algorithm interface layer. The testing device for the operating system of the security chip can effectively improve the writing and debugging speed of the testing script.

Description

Technical field [0001] The invention relates to the field of security chip testing, in particular to a security chip operating system testing device. Background technique [0002] Smart cards are also called IC cards. According to the different integrated circuits used in IC cards, it can be divided into memory cards, logic encryption cards, CPU cards and radio frequency cards. Because the CPU card integrates a microprocessor, a storage unit and a chip operating system COS (Chip Operating System), a complete computer system is formed. [0003] The operating system COS of the CPU card is the most important part of the chip to realize the main application functions. It is the key to the safe storage and access of important information such as data, files, and keys in the security chip. The application of the actual functions in the chip must rely on the normal realization of the COS function, so there must be targeted tests for the correct realization of the COS function to ensure ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F15/78G06F11/36G06F8/38
Inventor 张伟付青琴刘佳王于波庞振江李延梁昭庆袁家辉
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products