Converter valve test system based on high voltage square wave pulse excitation and method thereof

Abstract

The invention discloses a converter valve test system based on high voltage square wave pulse excitation. The system includes a high voltage square wave pulse generating unit, a first voltage dividingunit, a second voltage dividing unit, a standard impedance and data collecting unit and a sample. The present further discloses a converter valve test method based on high voltage square wave pulse excitation. The system is advantaged in that measurement accuracy can be improved through utilizing high-voltage square-wave pulses instead of sinusoidal pulses in a conventional test system, moreover,characteristics of the high-voltage square wave pulses can be utilized to obtain the impedance spectrum information in the higher frequency domain range in the test, and test efficiency is improved.

Description

technical field [0001] The disclosure belongs to the technical field of high-voltage direct current transmission technology and thyristor converter valve testing, and in particular relates to a converter valve testing system and method based on high-voltage square wave pulse excitation. Background technique [0002] Due to the significant advantages of high-voltage direct current transmission in long-distance large-capacity transmission and asynchronous networking, it has developed rapidly in my country. With the continuous improvement of the DC transmission voltage level, the number of thyristor-level units used in the converter valve is more, and due to the constraints of the project progress during the on-site acceptance and annual maintenance, higher requirements are put forward for the test efficiency. [0003] The converter valve test system is a test instrument for valve manufacturers to carry out routine test, on-site acceptance test and annual maintenance test of pr...

AI Technical Summary

Problems solved by technology

However, due to the variety of test items, different excitation sources are still required in different test contents, and because of the built-in logic circuit of some types of test products, it is necessary to increase the amplitude of the high-frequency sinusoidal voltage to 100% during impedance testing. Volt level

Therefore, on the one hand, the complexity of the test system is greatly increased, which is not conducive to miniaturization; on the other hand, each test is individually stimulated, and there are also shortcomings such as low test efficiency.

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