PCIe pressure eye pattern test calibration method

Abstract

The PCIe pressure eye diagram test calibration method comprises the steps of obtaining a loss value from a loss calibration board signal input point in a test link to a mirror image channel output point on to-be-tested equipment, and storing a channel characteristic obtained based on the loss value as an S parameter file; Performing eye diagram simulation according to the S parameter file, and using parameter values meeting PCIe bus protocol requirements in the eye diagram simulation; Adjusting parameter values in the eye diagram simulation until a pressure eye diagram result meeting PCIe busprotocol requirements is obtained, and recording the adjusted parameter values; And configuring the adjusted parameter values into an error rate tester for pressure eye diagram testing. By using the PCIe pressure eye diagram test calibration method provided by the invention, the problem of calibration failure caused by insufficient signal-to-noise ratio of an oscilloscope in the traditional calibration method can be solved, the calibration time is saved, and the calibration flexibility is enhanced.

Description

technical field [0001] This field relates to the field of computers, and more particularly to a PCIe stressed eye diagram test calibration method. Background technique [0002] At present, the PCIe bus is widely used as a high-speed serial bus in computers, servers, switches, routers and other equipment. In order to ensure the consistency of the design, it is necessary to verify the receiving channel and receiver of PCIe in the system. Stressed eye diagram test is an important test method for serial bus receiving link and receiver consistency. Such as figure 1 , the specific principle is to use BERT (bit error rate tester) to generate the stress eye diagram signal defined by the bus protocol, send the signal to the test point defined by the bus protocol, and the signal passes through the receiver link to be tested from this position , and finally reach the receiver under test. Configure the interface to be tested to enter the loopback mode, and the BERT receives the signa...

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Problems solved by technology

[0005] In view of this, the purpose of the embodiment of the present invention is to propose a PCIe stress eye diagram test calibration method, by using the method of the present invention can solve the problem of calibration failure due to insufficient signal-to-noise ratio of the oscilloscope in the traditional calibration method, while saving Calibration time for enhanced calibration flexibility

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