Timing sequence calibration method, and chip test machine
A technology of timing calibration and chip testing, which is applied in the field of signal processing and can solve the problems of inconvenient use, increased equipment maintenance and use costs, etc.
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[0042] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, only some structures related to the present invention are shown in the drawings but not all structures.
[0043] It should be noted that the terms "system" and "network" in the present invention are often used interchangeably herein. The "and / or" mentioned in the embodiments of the present invention means "including any and all combinations of one or more related listed items. The term "first" in the specification, claims and drawings of the present invention , "second", "third", "fourth" and so on are used to distinguish different objects, not to limit a specific order.
[0044] It should also be noted that the foll...
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