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Timing sequence calibration method, and chip test machine

A technology of timing calibration and chip testing, which is applied in the field of signal processing and can solve the problems of inconvenient use, increased equipment maintenance and use costs, etc.

Active Publication Date: 2019-04-16
SUZHOU HUAXING YUANCHUANG TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method requires the use of a signal analyzer, which is not easy to carry and use, and increases the maintenance and use costs of the equipment

Method used

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  • Timing sequence calibration method, and chip test machine
  • Timing sequence calibration method, and chip test machine
  • Timing sequence calibration method, and chip test machine

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Embodiment Construction

[0042] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, only some structures related to the present invention are shown in the drawings but not all structures.

[0043] It should be noted that the terms "system" and "network" in the present invention are often used interchangeably herein. The "and / or" mentioned in the embodiments of the present invention means "including any and all combinations of one or more related listed items. The term "first" in the specification, claims and drawings of the present invention , "second", "third", "fourth" and so on are used to distinguish different objects, not to limit a specific order.

[0044] It should also be noted that the foll...

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Abstract

The invention discloses a timing sequence calibration method, and a chip test machine. The method comprises the following steps: calibrating an internal timing sequence of the chip test machine; sequentially adjusting a timing sequence window corresponding to each data channel of a workpiece to be tested; and calculating a timing sequence calibration value according to the timing sequence window corresponding to each data channel, and configuring the timing sequence calibration value in each data channel. By adoption of the timing sequence calibration method disclosed by the embodiment of theinvention, the timing sequence calibration of an MIPI signal is achieved without adding any device, thereby ensuring the transmission rate and stability of the MIPI signal, and reducing the maintenance and use costs of the device.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of signal processing, in particular to a timing calibration method and a chip testing machine. Background technique [0002] A complementary metal oxide semiconductor sensor (Complementary Metal Oxide Semiconductor Sensor, CMOS Sensor) is widely used as an image sensor in digital photography due to its advantages of high sensitivity and short exposure time. [0003] Existing CMOS sensor chips are usually tested by transferring the CMOS sensor chips on a chip testing machine during testing, because the timing of the mobile industry processor interface (Mobile Industry Processor Interface, MIPI) signal generated by the CMOS sensor chip is very different from the test. Therefore, it is usually necessary to use a signal analyzer to measure the timing of the MIPI signal, and then perform corresponding timing compensation. However, this method requires the use of a signal analyzer, which is ...

Claims

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Application Information

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IPC IPC(8): H04N5/374G01R31/28
CPCG01R31/2825H04N25/76
Inventor 陈耀闯郭彦锋尹忠平
Owner SUZHOU HUAXING YUANCHUANG TECH CO LTD
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