Chip test fixture

A technology of chip testing and fixtures, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of limited test stations, fixed size, general protection performance of chip test fixtures, etc., and achieve good use effect and good protection Effect

Pending Publication Date: 2019-04-05
富芯微电子有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing chip test fixtures have certain drawbacks when in use. The existing chip test fixtures have a general effect on fixing the IC chip during use, and the IC chip is prone to fall off during the test process. When testing IC chips, the size of a single jig test chip is relatively fixed, which cannot meet the test of chips of different sizes. In addition, the existing chip test jigs have general protection performance and limited test stations, which brings serious problems to actual use. certain influence

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Examples

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Embodiment Construction

[0023] Such as Figure 1-3 As shown, a chip test fixture includes a test seat 1, two groups of fixed plates 2 are fixedly installed on the upper surface of the test seat 1, and the front surface and the rear surface of the fixed plate 2 are provided with test probes 3, and the test seat 1 The inner side of the upper surface of the test seat 1 is embedded with contact pins 4, the lower surface of the test seat 1 is fixedly installed with two sets of support feet 5, and the upper surface of the test seat 1 is provided with a signal line 6;

[0024] The lower surface of the test seat 1 is provided with a fuse 7 corresponding to the lower end of the contact pin 4, and a test needle cover 8 is installed on the upper periphery of the test probe 3, and the inner surface of the test needle cover 8 is connected to the outer surface of the test probe 3. A return spring 9 is wrapped between them, and the return spring 9 can return the test probe 3 to its original position when the test p...

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Abstract

The invention discloses a chip test fixture. The chip test fixture comprises a test base, wherein two groups of fixed plates are fixedly installed on the upper surface of the test base, and the frontsurface and the rear surface of each fixed plate are provided with test probes respectively; and contact pins are installed at the inner side of the upper surface of the test base in an embedded mode,two groups of supporting legs are fixedly installed on the lower surface of the test base, a signal line penetrates through the upper surface of the test base, and fuses are arranged at correspondingpositions of the lower surface of the test base and the lower ends of the contact pins. According to the chip test fixture, since a reset spring is arranged in each test probe sleeve to fix the corresponding test probe, the test stability and reliability of the test fixture can be improved when a chip is tested, and detachment of the chip in the testing process is avoided; and moreover, IC chipswith different thickness can be tested, chip with different dimensions can be tested, multiple test stations are arranged, separate testing of multiple individual chips can be realized, and chip testing conditions under different temperature can be met.

Description

technical field [0001] The invention belongs to the field of detection of semiconductor integrated circuits, and relates to a test fixture, in particular to a TVS / TSS chip test fixture. Background technique [0002] The chip test fixture is a fixture for testing IC chips. It can fix the IC chip and complete the power-on test of the IC chip to determine whether the IC chip is powered on normally, so as to screen the quality of the IC chip. [0003] Existing chip test fixtures have certain drawbacks when in use. The existing chip test fixtures have a general effect on fixing the IC chip during use, and the IC chip is prone to falling off during the test process, and the existing chip test fixtures When testing IC chips, the size of a single jig test chip is relatively fixed, which cannot meet the test of chips of different sizes. In addition, the existing chip test jigs have general protection performance and limited test stations, which brings serious problems to actual use. ...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/28
CPCG01R1/0425G01R31/2851
Inventor 沈春福吴飞张荣周体志邹有彪
Owner 富芯微电子有限公司
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