The invention relates to a prison abnormal condition monitoring method and a monitoring system based on depth learning
An abnormal situation and deep learning technology, applied in neural learning methods, instruments, biological neural network models, etc., can solve problems such as the inability to automatically identify abnormal behaviors, and achieve the effects of improving recognition accuracy, fast recognition, and reducing costs.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0045] figure 1 A flow chart of a method for monitoring abnormal conditions in prisons based on deep learning according to an embodiment of the present invention is shown. figure 2 It shows the working principle diagram of the prison abnormality monitoring method based on deep learning according to one embodiment of the present invention.
[0046] combine figure 1 and figure 2As shown, the prison abnormal situation monitoring method based on deep learning includes: S102: Based on the first sub-network, generate time series information of key points of the human body;
[0047] Step S102 includes steps S1021-S1023:
[0048] S1021: Using a convolutional neural network model to extract feature points of video information;
[0049] S1022: Determine the key point information of the human body according to the feature points;
[0050] S1023: Generate time-series information of key points of the human body according to the key point information of the human body;
[0051] Wher...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com