A method and device for extracting target scattering center features
A target scattering and scattering center technology, applied in radio wave measurement systems, instruments, etc., can solve the problems of difficult sparse solution of 2D-GTD model, large amount of calculation, easy to fall into local optimization, etc., and achieve fast and accurate sparse solution, accurate and efficient extraction , the effect of reducing the dimension
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[0029] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0030] figure 1 is a schematic diagram of the main steps of the method for extracting the features of the target scattering center according to the embodiment of the present invention.
[0031] Such as figure 1 As shown, the present invention is an embodiment of a method for extracting target scattering center features that can specifically...
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