Integrated circuit total ecological chain intelligent test analysis method
An integrated circuit, testing and analysis technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as inability to process simultaneously and quickly, equipment stop working, low production capacity, etc., to achieve real-time monitoring of test results and safety sex high effect
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[0116] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0117] Intelligent test and analysis methods for the entire ecological chain of integrated circuits, including: data acquisition layer, big data processing and analysis layer, and application layer, providing integrated circuit test parameter index analysis, wafer test yield analysis, test time analysis, wafer MAP diagram information, SummaryCheck and analysis, TouchDown, Report (report), SQLHistory (test record) analysis, this technology has the characteristics of data intercommunication and data backup, high security, and can realize the functions of data retrieval, tracking and analysis of the whole ecological chain information, Facilitate real-time monitoring of test results.
[0118] Step 1: R1: Input product name Device, test batch number Lot, test machine number Tester and other information values, the default is empty, that is, full search.
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