Solar cell sheet EL defect tester

Abstract

The invention relates to a solar cell sheet EL defect testing machine, which includes a rack, a conveying mechanism mounted on the rack and a feeding mechanism, a test mechanism and a blanking mechanism arranged in order; A feeding mechanism includes at least one first horizontal linear module, at least one storage mechanism and at least one first vacuum adsorption mechanism; the storage mechanismis located on one side of the conveying mechanism, a first vacuum suction mechanism is mounted on the first horizontal linear module, the test mechanism comprises a camera assembly, a lifting mechanism, a probe assembly and a copper plate assembly mounted on the lifting mechanism, the probe assembly and the copper plate being arranged opposite each other in the vertical direction; the blanking mechanism comprising at least one second horizontal linear module, at least one second vacuum suction mechanism and a sorting assembly; the second vacuum suction mechanism being mounted on the second horizontal linear module. The invention is suitable for mass sampling inspection and full inspection of EL defects of battery sheets. The test speed is fast, lthe fragmentation rate is low; the invention can adopt to customers with different needs, is high in test efficiency, and has Extensibility.

Description

technical field [0001] The invention relates to an EL defect testing machine for solar cells. Background technique [0002] Solar cells are energy-saving components with silicon as the main material. During the manufacturing process, due to some reasons, solar cells have various internal and external defects. Therefore, before leaving the factory, the cells need to be tested to control the product. quality. Since crystalline silicon has the characteristic of electroluminescence (EL for short), defective solar cells can be screened by EL test. [0003] However, the existing sorting machine has a low test speed and a high fragmentation rate, and can only be used to test cells of one size. When the number of cell grid lines changes, the test machine needs to be remade, which increases the cost and reduces the test efficiency. Moreover, the test effect is poor, and cells of different qualities cannot be sorted out. Contents of the invention [0004] The invention overcomes ...

AI Technical Summary

Problems solved by technology

[0003] However, the existing sorting machine has a low test speed and a high fragmentation rate, and can only be used to test cells of one size. When the number of cell grid lines changes, the test machine needs to be remade, which increases the cost and reduces the test efficiency. Moreover, the test effect is poor, and cells of different qualities cannot be sorted out.

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