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A tooling device for detecting silver ion migration

A silver ion and tooling technology, applied in the field of optical sensors, can solve problems such as difficulty in capturing clear photos, difficulty in focusing the lens, and quality of products, to avoid wire harness damage, avoid collision damage, and improve efficiency.

Active Publication Date: 2022-01-04
BEIJING INST OF CONTROL ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] b. Viewed under a high-power microscope, as long as there is a slight jitter, the lens will be difficult to focus; for devices with small spacing, the jitter will cause repeated detection or missed detection, which has hidden dangers to product quality
[0008] c. After the migration of silver ions is detected, two people are required to cooperate to complete the photo-taking operation, and take pictures of the migration phenomenon under a microscope with a higher magnification. Because the border of the circuit board held by the inspector will shake slightly, it is difficult to capture clearly photo

Method used

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  • A tooling device for detecting silver ion migration
  • A tooling device for detecting silver ion migration
  • A tooling device for detecting silver ion migration

Examples

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Embodiment 1

[0040] A tooling device for detecting the migration of silver ions comprises a rotating table and a supporting frame base. Both the rotating table and the base of the supporting frame are made of titanium alloy. Titanium alloy has the advantages of low density, high specific strength, good corrosion resistance, and good process performance. It is an ideal aerospace engineering structural material. figure 1 is the top view of the turntable; figure 2 is a cross-sectional view of the turntable; image 3 is the front view of the support frame base; Figure 4 is a cross-sectional view of the support frame base; Figure 5 It is a top view of the base of the support frame.

[0041]The rotary table is designed as a hollow four-layer structure. The first layer structure 1 on the top is a ring platform with a diameter of φ30mm. The ring part is designed with three threaded holes to match the installation of the external circuit board. The hole diameter is φ2mm, one of which is It i...

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Abstract

A tooling device for detecting the migration of silver ions, comprising a rotary table and a support frame base; the rotary table includes a four-layer structure, the first layer is circular, the second layer is semi-cylindrical, and the third layer is circular , the fourth layer is hemispherical, the first layer, the second layer, the third layer and the fourth layer of the rotating table are sequentially connected; the base of the support frame is stepped cylindrical, and the center of the support frame base is provided with a through hole; the fourth layer of the turntable is detachably installed in the through hole of the support frame base; the diameter of the fourth layer of hemisphere of the turntable is greater than the diameter of the through hole of the support frame base; the turntable can be Rotate horizontally or tiltingly or a combination of both on the base of the support frame.

Description

technical field [0001] The invention relates to a tooling device for detecting silver ion migration, which belongs to the field of optical sensors. Background technique [0002] The infrared earth sensor is an important component of various series of high-orbit space satellites. Its working principle is to generate photocurrent, which is used to sense and receive the raster signal generated by the scanning structure. Therefore, the infrared earth sensor is a key component to ensure the high-orbit series of satellites. [0003] The OP604 device (photoelectric transistor) is an important device of the infrared earth sensor. It is a photoelectric device used in the field of aerospace products. This device has the characteristics of high packaging density, small size, complex structure, and difficult detection. Its shape is cylindrical , with a diameter of 1.47mm. Both electrodes of the phototransistor are covered with gold-plated layers, and there is an extremely thin insulatin...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/84
CPCG01N21/84
Inventor 王克香易伶刘旭力吴广东刘豫东张崇英李铮王京伟林光张子玉
Owner BEIJING INST OF CONTROL ENG
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