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Three-dimensional scanning method and system

A technology of three-dimensional scanning and three-dimensional data, which is applied in the field of three-dimensional scanning methods and systems, and can solve the time-consuming and labor-intensive problems of characteristic data

Active Publication Date: 2020-12-29
SHINING 3D TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Based on this, it is necessary to provide a 3D scanning method and system for the time-consuming and labor-intensive problem of manually pasting points to obtain feature data.

Method used

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  • Three-dimensional scanning method and system

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Embodiment Construction

[0029] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of ...

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Abstract

The invention relates to a three-dimensional scanning system for acquiring three-dimensional data of an object, comprising: a projector for projecting a feature image of a first wave band to the scanned object, the feature image including a plurality of key features. The scanner includes a projection module for emitting the scanning light of the second waveband to the surface of the scanned object, and the first waveband and the second waveband do not interfere with each other; The characteristic image of the object, to obtain the three-dimensional data of the key features projected on the surface of the scanned object; the second acquisition module is used to collect the scanning light reflected by the scanned object in the second wave band, and obtain the dense three-dimensional points on the surface of the scanned object cloud data. The present invention provides a three-dimensional scanning system that collects characteristic images of the first waveband and scanning light reflected by the second waveband, which is less prone to interference, so that the collected three-dimensional data is more accurate.

Description

technical field [0001] The invention relates to the field of three-dimensional digitization, in particular to a three-dimensional scanning method and system. Background technique [0002] The current 3D scanning method needs to manually paste the points, paste the mark points or features on the surface of the measured object, and use photogrammetry to take pictures of the mark points and obtain their 3D data; after that, import the 3D data of the mark points or features, and use a scanner Surrounding the object under test, use marker points or features to stitch and scan. After scanning, it is necessary to manually remove the pasting points, wasting time and manpower. Contents of the invention [0003] Based on this, it is necessary to provide a three-dimensional scanning method and system for the time-consuming and laborious problem of manually pasting points to obtain feature data. [0004] A three-dimensional scanning system for acquiring three-dimensional data of an o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/25G01B11/002G06T7/521G06T2207/10152G01B11/2513G01B11/2522G06F18/253G06F18/256
Inventor 赵晓波王文斌
Owner SHINING 3D TECH CO LTD
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