Uniformity control device for wafer production etching

A control device and uniformity technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of poor convenience, low reliability, inconvenient control of solution speed and volume, etc.

Active Publication Date: 2019-01-01
广西中科蓝谷半导体科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] As we all know, the control device for the uniformity of wafer production etching is a device used in the semiconductor manufacturing process to use the chemical reaction between the solution and the pre-etching material to remove the part that is not masked by the masking film material. It has been widely used in the field of semiconductor manufacturing; the existing control device for the uniformity of wafer production etching includes a workbench and a glue dropper, and the glue dropper is located above the workbench; the existing When using the control device for the uniformity of wafer production etching, the user places the pre-etching material on the workbench, draws the solution with the rubber dropper, and then drops the solution to the pre-etching through the rubber dropper. The material can be used; the existing control device for the uniformity of wafer production and etching is found to be inconvenient to clamp, and the convenience of use is poor; it is inconvenient to control the speed and amount of the solution, and the reliability of use is relatively low. Low

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  • Uniformity control device for wafer production etching
  • Uniformity control device for wafer production etching
  • Uniformity control device for wafer production etching

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Embodiment Construction

[0023] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0024] Such as Figure 1 to Figure 8As shown, a control device for the uniformity of wafer production etching of the present invention includes a workbench 1 and a glue dropper 2, and the glue dropper 2 is located above the workbench 1; it also includes a first support rod 3. Second support rod 4, front limit plate 5, rear limit plate, left baffle plate 6, right baffle plate 7, push rod 8, rack 9, rear incomplete gear, front incomplete gear 10, rear connection Rod, spring 11, front connecting rod 12, front fixed rod 13 and rear fixed rod, the top of the first support rod 3 is connected with the top of the workbench 1, the left end of the second support rod 4 is connected ...

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Abstract

The invention relates to the technical field of semiconductor manufacturing accessories, and especially relates to a uniformity control device for wafer production etching, wherein the device achievesthe convenient clamping, and is easy for the control of the speed and quantity of solution. The device includes a workbench and a plastic dropper, and also comprises a first support bar, a second support bar, a front limiting plate, a rear limiting plate, a left baffle plate, a right baffle plate, a push rod, a rack, a rear incomplete gear, a front incomplete gear, a rear connecting rod, a frontconnecting rod, a front fixed rod and a rear fixed rod. The device further comprises a third supporting rod, a fourth supporting rod, a first rotating rod, a second rotating rod, a first threaded rod,an upper gear , a lower gear, a first connecting rod, a second connecting rod, a third connecting rod, a fourth connecting rod, a lantern ring, a left clamping plate and a right clamping plate, wherein the right side wall of the first supporting rod is provided with a first placement groove and a second placement groove, and the first placement groove and the second placement groove are respectively provided with a first ball bearing and a second ball bearing.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing auxiliary devices, in particular to a control device for uniformity of wafer production and etching. Background technique [0002] As we all know, the control device for the uniformity of wafer production etching is a device used in the semiconductor manufacturing process to use the chemical reaction between the solution and the pre-etching material to remove the part that is not masked by the masking film material. It has been widely used in the field of semiconductor manufacturing; the existing control device for the uniformity of wafer production etching includes a workbench and a glue dropper, and the glue dropper is located above the workbench; the existing When using the control device for the uniformity of wafer production etching, the user places the pre-etching material on the workbench, draws the solution with the rubber dropper, and then drops the solution to the pre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/67
CPCH01L21/67075H01L21/6715
Inventor 王昌华
Owner 广西中科蓝谷半导体科技有限公司
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