Uniformity control device for wafer production etching
A control device and uniformity technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of poor convenience, low reliability, inconvenient control of solution speed and volume, etc.
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[0023] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.
[0024] Such as Figure 1 to Figure 8As shown, a control device for the uniformity of wafer production etching of the present invention includes a workbench 1 and a glue dropper 2, and the glue dropper 2 is located above the workbench 1; it also includes a first support rod 3. Second support rod 4, front limit plate 5, rear limit plate, left baffle plate 6, right baffle plate 7, push rod 8, rack 9, rear incomplete gear, front incomplete gear 10, rear connection Rod, spring 11, front connecting rod 12, front fixed rod 13 and rear fixed rod, the top of the first support rod 3 is connected with the top of the workbench 1, the left end of the second support rod 4 is connected ...
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