Calibration method of scalar domain MEMS inertial system

A technology of inertial system and calibration method, applied in the direction of measuring devices, instruments, etc., can solve the problems that are not suitable for MEMS inertial system calibration, etc., and achieve the effect of simple calculation

Active Publication Date: 2018-12-25
SUZHOU UNIV
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Problems solved by technology

Currently commonly used calibration methods require reliable external reference equipment, which is often not suitable for cheap MEMS inertial system calibration

Method used

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  • Calibration method of scalar domain MEMS inertial system
  • Calibration method of scalar domain MEMS inertial system
  • Calibration method of scalar domain MEMS inertial system

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Embodiment

[0065] The error calibration of MEMS inertial system involves the main error parameters such as scale factor, non-orthogonality, zero bias and installation error angle. The current calibration process uses a three-axis turntable for full parameter error calibration, and this process usually takes several hours to complete. However, due to the poor stability of the error parameters of the MEMS inertial system, the characteristics of error parameter changes will appear in a relatively long period of time. Therefore, when performing MEMS inertial system error calibration, it is necessary to quickly simplify the calibration process, realize parameter calibration, reduce dependence on external equipment, and improve system portability.

[0066] The inventor found through research that there is a simplified model for the MEMS inertial system and the error model, and carried out modeling analysis on it, and designed a specific calculation method through the characteristics of the err...

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Abstract

The invention relates to a calibration method of a scalar domain MEMS inertial system, and solves the problem of a simplification of an error parameter calibration of a MEMS inertial system. The method mainly comprises the following steps: Step 1, establishing a table to quantify a sensor error model of the MEMS inertial system; Step 2, performing a carrier flipping motion, collecting several position data, and completing effective data acquisition calibrated by a MEMS accelerometer; Step 3, performing a carrier speed motion, changing carrier orientation, and completing date acquisition calibrated by a MEMS gyroscope; Step 4, using an iterative optimization algorithm to realize error parameter estimation; Step 5, if k = M which is the number of calibration posture changes in the scalar field, outputting the estimated error parameter , and completing the calibration process; if k < M, indicating that the calibration process is not completed, repeating the steps 2 to 5 above until the calibration process ends.

Description

technical field [0001] The invention relates to MEMS, in particular to a scalar domain MEMS inertial system calibration method. Background technique [0002] At present, MEMS micro-inertial systems are being more and more applied to the military, civilian and industrial fields, and their high cost performance and low power consumption characteristics have increasingly broad application prospects. Since the MEMS inertial system has relatively large defects in measurement accuracy and measurement noise, it is necessary to calibrate its error in the actual use process. Currently commonly used calibration methods all require reliable external reference equipment, which is often not suitable for cheap MEMS inertial system calibration. At the same time, the traditional calibration process usually calibrates parameters such as the secondary error term of the inertial system to improve the measurement accuracy of the system. In the MEMS inertial system, due to the large measuremen...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C25/005
Inventor 徐祥徐大诚
Owner SUZHOU UNIV
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