Method and system for processing sample information

Abstract

The invention provides a sample information processing method and a system, which relate to the technical field of material sampling inspection. The method comprises the following steps: scanning a first two-dimensional code of a sample, obtaining basic information of the sample and a sample identification, and storing the basic information and the sample identification correspondingly; Processingthe basic information of the sample to obtain the expected parameters, generating a second two-dimensional code according to the expected parameters and the sample identification, and overlaying thefirst two-dimensional code with the second two-dimensional code; After the sample is detected, the detection result of the sample is obtained, and the second two-dimensional code of the sample is scanned to obtain the sample identification and expected parameters. Generating a third two-dimensional code including the expected parameter and the detection result, Instead of manual encoding and decoding of blind sample processing work, reduce the operator's heavy work, while avoiding errors in human operation, and through the systematic operation of blind sample processing, even if the number ofsamples, can ensure the work efficiency and accuracy.

Description

technical field [0001] The invention relates to the technical field of material sampling inspection, in particular to a sample information processing method and system. Background technique [0002] In order to ensure the quality of power supplies, random inspections are carried out on equipment and materials that will be connected to the power grid. Arrival random inspections and special random inspections are important quality control methods, which effectively encourage suppliers to self-examine and effectively strengthen internal quality control. At present, whether it is the arrival sampling inspection or special sampling inspection, it is necessary to take samples first, seal the samples, and then conduct blind sample processing on the sealed samples by supervisors (that is, remove the manufacturer information of the samples and the information of the inspection personnel and other samples. Source information), add the first sample code on the sample, and record the fi...

AI Technical Summary

Problems solved by technology

[0004] In view of this, the purpose of the present invention is to provide a sample information processing method and system to solve the current blind sample processing of electric power material sampling inspection due to the need for quality control personnel and supervisors to manually code separately, and through artificially customized supervision tables and The checklist is stored, and the expected parameters and test results of the sample are searched manually on the supervision list and checklist. The whole process is greatly affected by human influence, and when a large number of blind samples need to be processed, the work efficiency is low and errors are prone to occur.

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