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Ultrahigh-spectral transmittance etalon and visibility measurement device

A standard measuring tool and measuring device technology, applied in the field of optical metrology, can solve the problems of inaccurate measurement of ultra-high transmittance, large measurement uncertainty of transmittance parameters, etc., and achieve the goal of improving the measurement range, flatness and uniformity Effect

Pending Publication Date: 2018-12-21
NAT INST OF METROLOGY CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] An embodiment of the present invention provides a standard measuring tool for ultra-high spectral transmittance, which is used to solve the problems in the prior art that ultra-high transmittance cannot be accurately measured and the measurement uncertainty of transmittance parameters is large

Method used

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  • Ultrahigh-spectral transmittance etalon and visibility measurement device
  • Ultrahigh-spectral transmittance etalon and visibility measurement device
  • Ultrahigh-spectral transmittance etalon and visibility measurement device

Examples

Experimental program
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Effect test

Embodiment 1

[0041] Embodiment 1 of the present invention provides an ultra-high spectral transmittance standard measuring tool, including:

[0042] A fixing part and optical filters, the said optical filters are fan-shaped structures arranged alternately on the fixing part for filtering or blocking the continuous light emitted by the light source. The area ratio of the filter can be set according to requirements, and the filter can be selected with a known transmittance according to requirements. There can be one or more optical filters, which can be arranged on the fixing member alternately with air or other optical filters with known transmittance. The filter is fixed on the fixture by screws or other means. When the continuous light is irradiated on the etalon, part of the light is emitted through the filter, and part of the light is emitted through other media next to the filter. Wherein, the continuous light may be visible light, or ultraviolet or infrared radiation, and the light so...

Embodiment 2

[0082] Embodiment 2 of the present invention provides an ultra-high spectral transmittance standard measuring tool, including:

[0083] A fixing part and optical filters, the said optical filters are fan-shaped structures arranged alternately on the fixing part, and are used for modulating the continuous light emitted by the light source into light of a fixed frequency. The area ratio of the filter can be set according to requirements, and the transmittance of the filter can be selected from a filter with known transmittance according to requirements. There can be one or more optical filters, which can be arranged on the fixing member alternately with air or other optical filters with known transmittance. The filter is fixed on the fixture by screws or other means. When the continuous light is irradiated on the etalon, part of the light is emitted through the filter, and part of the light is emitted through other media next to the filter. Wherein, the continuous light may be...

Embodiment 3

[0095] An ultra-high spectral transmittance standard gauge is provided for Example 3 of the present application, so as to improve the flatness of the transmittance curve. The etalon includes:

[0096] A fixing part and optical filters, the said optical filters are fan-shaped structures arranged alternately on the fixing part, and are used for modulating the continuous light emitted by the light source into light. The area ratio of the filter can be set according to requirements, and the transmittance of the filter can be selected from a filter with known transmittance according to requirements. There can be one or more optical filters, which can be arranged on the fixing member alternately with air or other optical filters with known transmittance. The filter is fixed on the fixture by screws or other means. When the continuous light is irradiated on the etalon, part of the light is emitted through the filter, and part of the light is emitted through other media next to the ...

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Abstract

The invention discloses an ultrahigh-spectral transmittance etalon, which comprises a fixed part and light filters, wherein the light filters are of a sector structure, are alternately arranged on thefixed part and are used for filtering or shielding continuous light emitted from a light source. The upper limit of measurement of the transmittance is improved or the lower limit of measurement of the transmittance is reduced through alternately arranging at least one light filter with fixed transmittance on the fixed part and setting the sector area / central angle ratios of the light filters, the measurement range of the spectral transmittance etalon is greatly improved, meanwhile, the measurement uncertainty on the transmittance is greatly reduced, the spectral flatness of a transmittance curve is improved and the measurement uniformity on the transmittance is improved.

Description

technical field [0001] The invention relates to the technical field of optical metrology, in particular to an ultra-high spectral transmittance standard measuring tool and a visibility measuring device. Background technique [0002] Transmittance is a very important optical parameter in the field of optical metrology technology and an important parameter for evaluating optical performance. It is often used in optical components, optical films, and visibility measuring instruments. With the continuous progress and development of science and technology, laser technology and optical thin film technology have been developed rapidly, and the requirements for material transmittance performance are getting higher and higher, which is higher than 0.995. Visibility refers to the maximum distance at which objects can be identified from the background. It is a weather indicator to understand the stability and vertical structure of the atmosphere, and it is also an extremely important f...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/27G01J3/28G01J3/12
CPCG01J3/12G01J3/2823G01N21/27G01N21/274G01J2003/1217
Inventor 李奕林延东徐楠吴厚平李建威周秉直李荣吴永顺
Owner NAT INST OF METROLOGY CHINA
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