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Radar radiation source individual recognition method and system based on Bayesian curve fitting

A Bezier curve and identification method technology, applied in the field of individual identification methods and systems for radar radiation sources based on Bezier curve fitting, and can solve the problem of high computational complexity

Inactive Publication Date: 2018-12-07
PLA STRATEGIC SUPPORT FORCE INFORMATION ENG UNIV PLA SSF IEU
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method and system for individual identification of radar radiation sources based on Bezier curve fitting, which is used to solve the problem of high computational complexity existing in the prior art

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  • Radar radiation source individual recognition method and system based on Bayesian curve fitting
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  • Radar radiation source individual recognition method and system based on Bayesian curve fitting

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Embodiment Construction

[0039] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0040] The general model of the received emitter signal is:

[0041]

[0042] Among them, A is the pulse amplitude, is the initial phase, f c is the signal carrier frequency, w(n) is the mean value is zero and the variance is σ 2 Gaussian white noise, the number of sampling points in the N pulse duration, is the phase modulation function, the commonly used There are the following types:

[0043] (1) single frequency pulse,

[0044] (2) chirp, K is the modulation rate;

[0045] (3) Phase encoding, such as two-phase encoding radar, c(n)=0 or 1 for the sub-pulse duration.

[0046] ΔA(n) and Represents the unintentional modulation of the envelope and phase, respectively. For practical radar transmitters, the imperfection of analog ...

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Abstract

The invention relates to a radar radiation source individual recognition method and system based on Bayesian curve fitting. The method is characterized by comprising the following steps: firstly, extracting a radar pulse signal UPMOP characteristic, and then fitting the characteristic by a Bayesian curve, and finally, taking the control point of the fitted curve as an individual characteristic tobe input to a neural network classifier. Starting from the actual characteristics of high feature dimension and low recognition efficiency faced by the radar radiation source individual identification, UPMOP with high stability is selected as an individual feature, the fitting of UPMOP is realized by Bayesian curve, the extracted control point is extracted to serve as a new individual recognitionfeature vector, and the feature dimension is greatly reduced. The problems that in the prior art, modeling is difficult, fingerprint features are not easy to measure, and operation complexity is highare solved.

Description

technical field [0001] The invention belongs to the technical field of signal processing, and in particular relates to a method and system for individual identification of radar radiation sources based on Bezier curve fitting. Background technique [0002] The core of individual radiation source identification is individual feature extraction. By measuring the received signal, the unique electromagnetic characteristics of the radiation source are associated with the individual radiation source (fingerprint identification technology), and the feature (fingerprint) is extracted from the collected signal to complete the feature. After selection and fusion, it is fed into the classifier. The analysis of the signal includes signal transient characteristic analysis and signal steady-state characteristic analysis. The signal steady-state characteristic analysis means that when the radiation source is working stably, there are not only artificially added amplitude modulation, freque...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/41
CPCG01S7/41
Inventor 邢小鹏黄洁陈世文赵拥军
Owner PLA STRATEGIC SUPPORT FORCE INFORMATION ENG UNIV PLA SSF IEU
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